Samsung SCLSeries manual Reliability Test Condition

RELIABILITY TEST CONDITION

NO

ITEMS

TEST CONDITION

PERFORMANCE

1

RATED DC VOLTAGE

-55℃~ +85℃

∼

2.5 35V

±

CAPACITANCE RANGE

MEASURING FREQUENCY : 120 12Hz

∼

∼

㎌

2

CAPACITANCE

MEASURING VOLTAGE : 0.5Vrms + 0.5 2V DC

0.1 330

MEASURING CIRCUITS : EQUIVALENT SERIES

TOLERANCE ON CAP.

CIRCUIT

±

±

10%,

20%

TANGENT OF LOSS

MEASUREMENT SHALL BE MADE UNDER THE

3

SAME CONDITIONS AS THOSE GIVEN FOR THE

ANGLE

MEASUREMENT OF CAPACITANCE.

THE RATED DC VOLTAGE SHALL BE APPLIED

TO TERMINALS ACROSS THE TEST CAPACITOR

㎂

Cx, BY THE METHOD AS SHOWN BELOW. THE

0.01CV or 0.5

WHICHEVER IS GREATER

LEAKAGE CURRENT SHALL THEN BE

MEASURED AFTER CHARGE FOR 5 MIN.

MEASURING CIRCUITS

RS

S2

A

+

S

+

4

LEAKAGE CURRENT

1

V

xC

-

-

WHERE

RS

Ω

: STANDARD RESISTOR(PROTECTIVE R :1K )

V : DC VOLTMETER OR ELECTRONIC

VOLTMETER

S1 : DC POWER SUPPLY SWITCH

S2 : PROTECTIVE SWITCH FOR A AMMETER

CX

: TEST CAPACITOR

A

: DC AM-METER FOR LEAKAGE CURRENT

AC VOLTAGE(0.5Vrms OR LESS) OF A

FREQUENCY SPECIFIED ON NEXT PAGE SHALL

BE APPLIED AND THE VOLTAGE DROP

ACROSS CAPACITOR TERMINALS SHALL BE

MEASURED

THE IMPEDANCE SHALL BE CALCULATED BY

5

IMPEDENCE

THE FOLLOWING EQUATION.

Impedance

Z

= E

WHERE

I

E : VOLTAGE DROP ACROSS THE CAPACITOR

TERMINALS

I : CURRENT FLOWING THROUGH THE

CAPACITOR

(FREQUENCY : 100

±

10kHz)

SCL Series