PRELIMINARY

CY7C1333H

 

Capacitance[11]

 

 

 

 

 

 

 

Parameter

 

Description

 

Test Conditions

100 TQFP Package

Unit

 

 

 

 

 

 

 

 

CIN

Input Capacitance

 

TA = 25°C, f = 1 MHz,

5

pF

 

 

 

 

VDD = 3.3V

 

 

 

CCLOCK

Clock Input Capacitance

 

5

pF

 

 

 

 

 

VDDQ=3.3V

 

 

 

CI/O

I/O Capacitance

 

5

pF

 

 

 

 

AC Test Loads and Waveforms

3.3V I/O Test Load

OUTPUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

3.3V

 

 

 

R = 317Ω

 

 

 

 

 

ALL INPUT PULSES

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VDDQ

 

 

 

 

 

 

 

 

 

 

 

Z0

= 50Ω

 

 

 

 

OUTPUT

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

RL

= 50Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

10%

 

 

 

 

 

 

90%

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

5 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

R = 351Ω

GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

≤ 1 ns

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

VL = 1.5V

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

INCLUDING

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(c)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

(a)

JIG AND

 

(b)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

SCOPE

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Switching Characteristics Over the Operating Range [12, 13]

90%

10%

≤ 1 ns

 

 

133 MHz

100 MHz

 

Parameter

Description

Min.

Max.

Min.

Max.

Unit

tPOWER

VDD(Typical) to the First Access[14]

1

 

1

 

ms

Clock

 

 

 

 

 

 

tCYC

Clock Cycle Time

7.5

 

10

tCH

Clock HIGH

2.5

 

4.0

tCL

Clock LOW

2.5

 

4.0

Output Times

 

 

 

 

ns

ns

ns

tCDV

tDOH

tCLZ

tCHZ

tOEV

tOELZ

tOEHZ

Data Output Valid after CLK Rise

 

6.5

 

8.0

ns

Data Output Hold after CLK Rise

2.0

 

2.0

 

ns

Clock to Low-Z[15, 16, 17]

0

 

0

 

ns

Clock to High-Z15, 16, 17]

 

3.5

 

3.5

ns

OE

 

LOW to Output Valid

 

3.5

 

3.5

ns

 

 

LOW to Output Low-Z[15, 16, 17]

0

 

0

 

ns

OE

 

 

HIGH to Output High-Z[15, 16, 17]

 

3.5

 

3.5

ns

OE

Set-up Times

tAS

 

Address Set-up before CLK Rise

1.5

 

2.0

tALS

 

 

 

 

 

 

 

 

 

 

 

ADV/LD

 

Set-up before CLK Rise

1.5

 

2.0

tWES

 

 

 

 

 

[A:D] Set-up before CLK Rise

1.5

 

2.0

WE,

BW

tCENS

 

CEN

Set-up before CLK Rise

1.5

 

2.0

tDS

 

Data Input Set-up before CLK Rise

1.5

 

2.0

tCES

 

Chip Enable Set-Up before CLK Rise

1.5

 

2.0

Notes:

12.Timing reference level is 1.5V when VDDQ=3.3V

13.Test conditions shown in (a) of AC Test Loads, unless otherwise noted.

ns

ns

ns

ns

ns

ns

14.This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD minimum initially before a Read or Write operation can be initiated.

15.tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.

16.At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve Three-state prior to Low-Z under the same system conditions

17.This parameter is sampled and not 100% tested.

Document #: 001-00209 Rev. **

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Cypress CY7C1333H manual Capacitance, AC Test Loads and Waveforms, Switching Characteristics Over the Operating Range 12