National Instruments NI 5911

Glossary

©NationalInstruments Corporation G-5 NI5911 User Manual

interrupt level the relativepriority at which a device can interrupt

ISA industry standard architecture

kkilo—the standard metric prefix for 1,000, or 103, used with units of

measure such as volts,hertz ,and m eters

kS 1,000 samples

LabVIEW laboratory virtual instrument engineering workbench—a graphical

programming ADE developed by National Instruments

LSB leastsignificant bit

m meters

MB megabytes of memory

memory buffer seebu ffer

MS million samples

MSB mostsignificantbit

Contents

Main Page Important Information Warranty Copyright Trademarks WARNINGREGARDING USE OF NATIONAL INSTRUMENTS PRODUCTS Conventions Contents Chapter 1 Taking Measurements with the NI 5911 Chapter 2 Hardware Overview Page Taking Measurements with the NI 5911 Installing the NI 5911 Connecting Signals Page Acquiring Data with Your NI 5911 Programmatically Controlling Your NI 5911 Interactively Controlling Your NI 5911 with VirtualBench-Scope Using the VirtualBench-Scope Soft Front Panel Acquiring Data Soft Front Panel Features Page Hardware Overview Differential Programmable Gain Input Amplifier (PGIA) Differential Input Grounding Considerations Input Ranges Input Impedance Input Bias Input Protection AC Coupling Oscilloscope and Flexible Resolution Modes Oscilloscope Mode Sampling MethodsReal Time and RIS Flexible Resolution Mode How Flexible Resolution Works Calibration Internally Calibrating the NI 5911 When Internal Calibration Is Needed What Internal Calibration Does Why Errors Occur During Acquisition External Calibration Triggering and Arming Analog TriggerCircuit Page Page TriggerHold-Off Memory Triggeringand Memor y Usage Multiple Record Acquisitions RTSI Bus Triggerand Clock Lines PFI Lines PFI Lines as Inputs PFI Lines as Outputs Synchronization A Specifications Acquisition System Acquisition Characteristics Accuracy Common-Mode Characteristics Filtering Dynamic Range Distortion Timebase System TriggeringSystems Page Calibration B Digitizer Basics Understanding Digitizers Nyquist Theorem Analog Bandwidth Sample Rate Vertical Sensitivity ADC Resolution Record Length TriggeringOptions Random Interleaved Sampling Page Making Accurate Measurements FigureB-7. DynamicRange of an 8-Bit ADC with Three Different Gain Settings Page Page C Technical Support Resources Web Support NI Developer Zone Customer Education System Integration Worldwide Support Glossary Symbols A B C D E F G H I Page N O P R S T U V W Index Numbers A B C E F G H I M N O P R S T V W