1234
Pin Function
| No. | Pin Name | I/O | Function | |
A | 1 | VSS | − | Digital GND | |
| 2 | NC | − | Non connection | |
|
|
|
|
| |
| 3 | NC | − | Non connection | |
|
|
|
|
| |
| 4 | DAAVD | − | Analog power supply for RF DAC | |
|
|
|
|
| |
| 5 | DAAOUT | O | RF DAC output | |
| 6 | DAAVS | − | Analog GND for RF DAC | |
|
|
|
|
| |
| 7 | DAVRO | I/O | Internal current setting for RF DAC | |
| 8 | DAVREF | I | Reference voltage input for RF DAC | |
|
|
|
|
| |
| 9 | NC | − | Non connection | |
|
|
|
|
| |
| 10 | ADAVS | − | Analog GND for RF ADC | |
|
|
|
|
| |
B | 11 | ADVRH | I | Reference voltage input for RF DAC (high) | |
|
|
|
| ||
| 12 | ADAVD | − | Analog power supply for RF DAC | |
|
|
|
|
| |
| 13 | ADVRL | I | Reference voltage input for RF DAC (low) | |
|
|
|
|
| |
| 14 | ADVIN | I | RF ADC input | |
|
|
|
|
| |
| 15 | TEST1 | I | Test pin, normally fixed to L | |
|
|
|
|
| |
| 16 | TEST2 | I | Test pin, normally fixed to L | |
| 17 | VSS | − | Digital GND | |
|
|
|
|
| |
| 18 | TEST3 | I | Test pin, normally fixed to L | |
|
|
|
|
| |
| 19 | TEST4 | O | Test pin, normally | |
| 20 | TEST5 | I | Test pin, normally fixed to L | |
C | 21 | TEST6 | I | Test pin, normally fixed to L | |
22 | TEST7 | I | Test pin, normally fixed to L | ||
| |||||
| 23 | TEST8 | I/O | Test pin, normally | |
|
|
|
|
| |
| 24 | TEST9 | I/O | Test pin, normally | |
|
|
|
|
| |
| 25 | TEST10 | I/O | Test pin, normally | |
|
|
|
|
| |
| 26 | TEST11 | I/O | Test pin, normally | |
|
|
|
|
| |
| 27 | TEST12 | I/O | Test pin, normally | |
|
|
|
|
| |
| 28 | VSS | − | Digital GND | |
|
|
|
|
| |
| 29 | TEST13 | I/O | Test pin, normally | |
| 30 | TEST14 | I/O | Test pin, normally | |
D | 31 | TEST15 | I/O | Test pin, normally | |
32 | TEST16 | I | Test pin, normally fixed to L | ||
| |||||
|
|
|
|
| |
| 33 | VDD | − | Digital power supply | |
|
|
|
|
| |
| 34 | TEST17 | O | Test pin, normally | |
|
|
|
|
| |
| 35 | TEST18 | O | Test pin, normally | |
| 36 | TEST19 | O | Test pin, normally | |
| 37 | TEST20 | O | Test pin, normally | |
| 38 | TEST21 | I | Test pin, normally fixed to L | |
| 39 | VSS | − | Digital GND | |
| 40 | TEST22 | I | Test pin, normally fixed to L | |
| 41 | TEST23 | I | Test pin, normally fixed to L | |
E | 42 | TEST24 | I | Test pin, normally fixed to L | |
| 43 | TEST25 | I | Test pin, normally fixed to L | |
| 44 | TEST26 | I | Test pin, normally fixed to L | |
| 45 | TEST27 | I | Test pin, normally fixed to L | |
| 46 | TEST28 | I | Test pin, normally fixed to L | |
| 47 | TEST29 | O | Test pin, normally | |
| 48 | TEST30 | O | Test pin, normally | |
| 49 | TEST31 | O | Test pin, normally | |
| 50 | VSS | − | Digital GND |
F
44
1 | 2 |
3 | 4 |
