Index

Index–2 WFM 601A, WFM 601E & WFM 601M User Manual

Remote, B–1
RS232, B–1
Connectors, rear panel, 2–6
Coprocessor code version, determining software version,
3–12
CRC
use in AP CRC measurements, 3–51
use in EDH measurements, 3–50
CRC value, in Serial format screen, 3–46
Cross hair cursor, on picture monitor output, 3–39
CRT
filter part number, 1–2
filter replacement, D–3
setting intensity, 3–12
Cursor Menu, 3–13
Cursors, 3–13
Both selection, 3–13
data cursor correlated, 3–39
on MON OUT video, 3–39
on picture monitor output, 3–39
timing, 3–13
timing Cursors with Magnification, 3–13
using in Waveform display, 3–58
using Markers, 3–13
using with Gain, 3–13
voltage, 3–13
D
Data
jitter measurement with Eye Pattern, 3–27
mode in Digital List display, 3–14
mode in Digital Waveform display, 3–16
viewing with Digital List display, 3–14
viewing with Digital Waveform display, 3–16
Data Cursor
correlation with Digital Waveform display, 3–16
on Digital Waveform display, 3–17
Data format
for Digital List display, 3–15
for Digital Waveform display, 3–16
Data Range, Serial format checks, 3–48
Diamond Display
checking RGB Gamut, 3–30
construction of the diamond graticule, 3–29
RGB gamut, 3–29
DIFF, Filter menu selection, 3–27
Digital List, 3–14
Freeze/Update selection, 3–15
Line Select interaction, 3–15
picking the data format, 3–15
Video and Data modes, 3–14
Digital Waveform, 3–16
in Functional Check, 1–24
output monitor signals, 3–17
picking the data format, 3–16
using Gain, 3–18
using Line Select, 3–18
Video and Data modes, 3–16
Direct, synchronization selection, 3–11
Display
Audio, 3–1
Bowtie, 3–5
Multiple, 3–41
Parade, 3–41
Serial format selection, 3–46
serial format selection, 3–50
setting intensity, 3–12
Vector modes, 3–53
Waveform, 3–58
E
EAV–SAV, in Configure WFM/VEC menu, 3–9
EDH, using to measure error rate, 3–50
EDH DET, front panel indicator, 2–4
Elapsed Time, Serial format selection, 3–46
Electrical specifications, A–1
Enclosure, cabinet selection, 1–5
Environmental Characteristics, A–9
EQ EYE, receiver equalization mode, 3–19
Error rate
AP CRC measurements, 3–51–3–53
EDH measurements, 3–50–3–53
measurements, 3–50–3–53
Errored seconds
full field, 3–46
Serial format screen, 3–45
EXT REF input, 2–7
External Reference Input, Loop–Through Inputs, 2–7
Eye Display
in Functional Check, 1–20
reference discussion, 3–19
EYE PATTERN, Configure menu, 3–10
Eye Pattern
See also Eye Display
10 Eye trigger mode, 3–21
aberration measurement, 3–23
amplitude measurement, 3–22
Clock BW filter, 3–19
Clock BW filters, 3–19
Configure menu, 3–10
EQ EYE mode, 3–19
FLAT mode, 3–19