Cypress CY7C1520KV18 manual TAP AC Switching Characteristics, TAP Timing and Test Conditions

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CY7C1516KV18, CY7C1527KV18

CY7C1518KV18, CY7C1520KV18

TAP AC Switching Characteristics

Over the Operating Range [13, 14]

Parameter

Description

Min

Max

Unit

tTCYC

TCK Clock Cycle Time

50

 

ns

tTF

TCK Clock Frequency

 

20

MHz

tTH

TCK Clock HIGH

20

 

ns

tTL

TCK Clock LOW

20

 

ns

Setup Times

 

 

 

 

 

 

 

 

 

tTMSS

TMS Setup to TCK Clock Rise

5

 

ns

tTDIS

TDI Setup to TCK Clock Rise

5

 

ns

tCS

Capture Setup to TCK Rise

5

 

ns

Hold Times

 

 

 

 

tTMSH

TMS Hold after TCK Clock Rise

5

 

ns

tTDIH

TDI Hold after Clock Rise

5

 

ns

tCH

Capture Hold after Clock Rise

5

 

ns

Output Times

 

 

 

 

 

 

 

 

 

tTDOV

TCK Clock LOW to TDO Valid

 

10

ns

tTDOX

TCK Clock LOW to TDO Invalid

0

 

ns

TAP Timing and Test Conditions

Figure 2 shows the TAP timing and test conditions. [14]

Figure 2. TAP Timing and Test Conditions

 

 

 

0.9V

 

 

 

 

 

 

50Ω

 

 

 

 

 

 

 

 

 

 

 

 

TDO

 

 

 

 

 

 

Z0

= 50Ω

 

 

 

CL = 20 pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ALL INPUT PULSES

1.8V

0.9V

0V

(a)GND

Test Clock

TCK

Test Mode Select

TMS

Test Data In

TDI

Test Data Out

TDO

tTH

tTMSS

tTDIS

tTL

tTCYC

tTMSH

tTDIH

tTDOV

 

 

 

t

 

 

 

 

 

 

 

 

TDOX

Notes

13.tCS and tCH refer to the setup and hold time requirements of latching data from the boundary scan register.

14.Test conditions are specified using the load in TAP AC Test Conditions. tR/tF = 1 ns.

Document Number: 001-00437 Rev. *E

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Contents Features ConfigurationsFunctional Description Cypress Semiconductor Corporation 198 Champion CourtLogic Block Diagram CY7C1516KV18 Logic Block Diagram CY7C1527KV18Doff CLKLogic Block Diagram CY7C1520KV18 Logic Block Diagram CY7C1518KV18BWS Pin Configuration Ball Fbga 13 x 15 x 1.4 mm PinoutCY7C1516KV18 8M x CY7C1527KV18 8M xCY7C1518KV18 4M x CY7C1520KV18 2M xPin Name Pin Description Pin DefinitionsSynchronous Read or Write Input. When Power supply Inputs to the Core of the Device Power Supply Inputs for the Outputs of the DeviceReferenced with Respect to TDO for JtagFunctional Overview Application Example Programmable ImpedanceEcho Clocks SRAM#1 ZQWrite Cycle Descriptions OperationFirst Address External Second Address Internal CommentsBWS0 Ieee 1149.1 Serial Boundary Scan Jtag Idcode TAP Controller State Diagram TAP Controller Block Diagram TAP Electrical CharacteristicsTAP AC Switching Characteristics TAP Timing and Test ConditionsIdentification Register Definitions Scan Register SizesInstruction Codes Register Name Bit SizeBoundary Scan Order Bit # Bump IDPower Up Sequence in DDR-II Sram Power Up SequencePLL Constraints VDD/ Vddq DoffElectrical Characteristics DC Electrical CharacteristicsMaximum Ratings Operating RangeAC Electrical Characteristics Capacitance Thermal ResistanceParameter Description Test Conditions Max Unit Parameter Description Test Conditions Fbga UnitSwitching Characteristics Parameter Min MaxParameter Min Max Output Times PLL TimingSwitching Waveforms Care UndefinedOrdering Information 250 167 Package Diagram Ball Fbga 13 x 15 x 1.4 mmWorldwide Sales and Design Support Products PSoC Solutions Sales, Solutions, and Legal InformationDocument History

CY7C1516KV18, CY7C1520KV18, CY7C1527KV18, CY7C1518KV18 specifications

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