Cypress CY7C1570V18 manual Features, Functional Description, Configurations, Selection Guide

Page 1

CY7C1566V18, CY7C1577V18

CY7C1568V18, CY7C1570V18

72-Mbit DDR-II+ SRAM 2-Word Burst Architecture (2.5 Cycle Read Latency)

Features

72-Mbit density (8M x 8, 8M x 9, 4M x 18, 2M x 36)

400 MHz clock for high bandwidth

2-word burst for reducing address bus frequency

Double Data Rate (DDR) interfaces

(data transferred at 800 MHz) at 400 MHz

Available in 2.5 clock cycle latency

Two input clocks (K and K) for precise DDR timing SRAM uses rising edges only

Echo clocks (CQ and CQ) simplify data capture in high-speed systems

Data valid pin (QVLD) to indicate valid data on the output

Synchronous internally self-timed writes

Core VDD = 1.8V ± 0.1V; IO VDDQ = 1.4V to VDD [1]

HSTL inputs and variable drive HSTL output buffers

Available in 165-Ball FBGA package (15 x 17 x 1.4 mm)

Offered in both Pb-free and non Pb-free packages

JTAG 1149.1 compatible test access port

Delay Lock Loop (DLL) for accurate data placement

Functional Description

The CY7C1566V18, CY7C1577V18, CY7C1568V18, and CY7C1570V18 are 1.8V Synchronous Pipelined SRAMs equipped with DDR-II+ architecture. The DDR-II+ consists of an SRAM core with advanced synchronous peripheral circuitry. Addresses for read and write are latched on alternate rising edges of the input (K) clock. Write data is registered on the rising edges of both K and K. Read data is driven on the rising edges of K and K. Each address location is associated with two 8-bit words (CY7C1566V18), 9-bit words (CY7C1577V18), 18-bit words (CY7C1568V18), or 36-bit words (CY7C1570V18) that burst sequentially into or out of the device.

Asynchronous inputs include an output impedance matching input (ZQ). Synchronous data outputs (Q, sharing the same physical pins as the data inputs, D) are tightly matched to the two output echo clocks CQ/CQ, eliminating the need for separately capturing data from each individual DDR SRAM in the system design.

All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the K or K input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry.

Configurations

With Read Cycle Latency of 2.5 cycles:

CY7C1566V18 – 8M x 8

CY7C1577V18 – 8M x 9

CY7C1568V18 – 4M x 18

CY7C1570V18 – 2M x 36

Selection Guide

Description

 

400 MHz

375 MHz

333 MHz

300 MHz

Unit

Maximum Operating Frequency

 

400

375

333

300

MHz

 

 

 

 

 

 

 

Maximum Operating Current

x8

1400

1300

1200

1100

mA

 

 

 

 

 

 

 

 

x9

1400

1300

1200

1100

 

 

 

 

 

 

 

 

 

x18

1400

1300

1200

1100

 

 

 

 

 

 

 

 

 

x36

1400

1300

1200

1100

 

 

 

 

 

 

 

 

Note

1.The QDR consortium specification for VDDQ is 1.5V + 0.1V. The Cypress QDR devices exceed the QDR consortium specification and are capable of supporting VDDQ = 1.4V to VDD.

Cypress Semiconductor Corporation • 198 Champion Court

San Jose, CA 95134-1709

408-943-2600

Document Number: 001-06551 Rev. *E

 

Revised March 11, 2008

[+] Feedback

Image 1
Contents Configurations FeaturesFunctional Description Selection GuideLogic Block Diagram CY7C1577V18 Logic Block Diagram CY7C1566V18Logic Block Diagram CY7C1570V18 Logic Block Diagram CY7C1568V18Ball Fbga 15 x 17 x 1.4 mm Pinout Pin ConfigurationCY7C1566V18 8M x CY7C1577V18 8M xCY7C1570V18 2M x CY7C1568V18 4M xPin Name Pin Description Pin DefinitionsSynchronous Read/Write Input. When Power Supply Inputs for the Outputs of the Device Power Supply Inputs to the Core of the DeviceTDO for Jtag TCK Pin for JtagFunctional Overview Application Example Valid Data Indicator QvldEcho Clocks SRAM#1 SRAM#2Operation Write Cycle DescriptionsComments Write cycle description table for CY7C1570V18 follows Write cycle description table for CY7C1577V18 followsDevice Into the device. D359 remains unalteredIeee 1149.1 Serial Boundary Scan Jtag Idcode State diagram for the TAP controller follows TAP Controller State DiagramTAP Electrical Characteristics TAP Controller Block DiagramTAP Timing and Test Conditions TAP AC Switching CharacteristicsScan Register Sizes Identification Register DefinitionsInstruction Codes Register Name Bit SizeBit Number Bump ID Boundary Scan OrderPower Up Waveforms Power Up Sequence in DDR-II+ SramPower Up Sequence DLL ConstraintsDC Electrical Characteristics Electrical CharacteristicsMaximum Ratings Range AmbientCapacitance AC Electrical CharacteristicsThermal Resistance Parameter Description Test Conditions Max UnitAC Test Loads and Waveforms AC Test Loads and WaveformsParameter Min Max Switching CharacteristicsHigh LOWRead/Write/Deselect Sequence 29, 30 Switching WaveformsNOP Read NOP WriteOrdering Information CY7C1566V18, CY7C1577V18 Ball Fbga 15 x 17 x 1.4 mm Package DiagramDocument History ECN No Issue Orig. Description of Change DateNXR IGS