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| PRELIMINARY | CY14B101P | |||
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Data Retention and Endurance |
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Parameter |
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| Description | Min | Unit | ||
DATAR | Data Retention |
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| 20 | Years | |||
NVC | Nonvolatile STORE Operations | 200 | K | |||||
Capacitance |
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Parameter[6] | Description |
| Test Conditions | Max | Unit | |||
CIN | Input Capacitance |
| TA = 25°C, f = 1MHz, | 6 | pF | |||
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| VCC = 3.0V |
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COUT | Output Pin Capacitance |
| 8 | pF | ||||
Thermal Resistance |
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Parameter[6] | Description |
| Test Conditions |
| Unit | |||
ΘJA | Thermal Resistance |
| Test conditions follow standard test methods | TBD | °C/W | |||
| (Junction to Ambient) |
| and procedures for measuring thermal |
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| impedance, per EIA / JESD51. |
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ΘJC | Thermal Resistance |
| TBD | °C/W | ||||
| (Junction to Case) |
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| Figure 24. AC Test Loads and Waveforms |
3.0V | 577Ω |
3.0V | |
| R1 |
OUTPUT | OUTPUT |
30 pF |
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| R2 | 5 pF | |
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| 789Ω |
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577Ω
R1
R2 789Ω
AC Test Conditions
Input Pulse Levels | 0V to 3V |
Input Rise and Fall Times (10% - 90%) | <3 ns |
Input and Output Timing Reference Levels | 1.5V |
Note
6. These parameters are guaranteed by design and are not tested.
Document #: | Page 23 of 32 |
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