Cypress CY7C1298H manual Pin Descriptions

Page 4

 

Pin Descriptions

 

 

 

 

 

 

CY7C1298H

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Pin

Type

 

 

 

Description

 

 

 

 

 

 

 

 

 

 

A0, A1, A

Input-

Address Inputs used

to select one of the 64K address locations. Sampled at the rising edge

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Synchronous

of the CLK if ADSP or ADSC is active LOW, and CE1, CE2, and CE3 are sampled active. A[1:0] are

 

 

 

 

 

 

 

 

 

 

 

 

fed to the two-bit counter.

 

 

 

 

 

 

 

[A:B]

Input-

Byte Write Select Inputs, active LOW. Qualified with

 

to conduct byte writes to the SRAM.

 

 

BW

BWE

 

 

 

 

 

 

 

 

 

 

 

Synchronous

Sampled on the rising edge of CLK.

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Global Write Enable Input, active LOW. When asserted LOW on the rising edge of CLK, a global

 

 

GW

 

 

 

 

 

 

 

 

 

 

 

Synchronous

write is conducted (ALL bytes are written, regardless of the values on BW[A:B] and BWE).

 

 

 

 

 

 

 

 

 

 

 

Input-

Byte Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must be

 

 

BWE

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW to conduct a byte write.

 

 

 

 

CLK

Input-

Clock Input. Used to capture all synchronous inputs to the device. Also used to increment the burst

 

 

 

 

 

 

 

 

 

 

 

Clock

counter when ADV is asserted LOW, during a burst operation.

 

 

 

 

 

1

 

 

 

Input-

Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

Synchronous

CE2 and CE3 to select/deselect the device. ADSP is ignored if CE1 is HIGH. CE1 is sampled only

 

 

 

 

 

 

 

 

 

 

 

 

when a new external address is loaded.

 

 

 

 

CE2

Input-

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction with

 

 

 

 

 

 

 

 

 

 

 

Synchronous

CE1 and CE3 to select/deselect the device. CE2 is sampled only when a new external address is

 

 

 

 

 

 

 

 

 

 

 

 

loaded.

 

 

 

 

 

3

 

 

 

Input-

Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

 

 

CE

 

 

 

 

 

 

 

 

 

 

 

Synchronous

CE1 and CE2 to select/deselect the device. CE3 is sampled only when a new external address is

 

 

 

 

 

 

 

 

 

 

 

 

loaded.

 

 

 

 

 

 

 

 

 

 

Input-

Output Enable, asynchronous input, active LOW. Controls the direction of the I/O pins. When

 

 

OE

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

LOW, the I/O pins behave as outputs. When deasserted HIGH, I/O pins are tri-stated, and act as

 

 

 

 

 

 

 

 

 

 

 

 

input data pins. OE is masked during the first clock of a read cycle when emerging from a deselected

 

 

 

 

 

 

 

 

 

 

 

 

state.

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Advance Input signal, sampled on the rising edge of CLK, active LOW. When asserted, it

 

 

ADV

 

 

 

 

 

 

 

 

 

 

 

Synchronous

automatically increments the address in a burst cycle.

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Processor, sampled on the rising edge of CLK, active LOW. When

 

 

ADSP

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers. A[1:0] are

 

 

 

 

 

 

 

 

 

 

 

 

also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recog-

 

 

 

 

 

 

 

 

 

 

 

 

nized. ASDP is ignored when CE1 is deasserted HIGH.

 

 

 

 

 

 

 

 

 

 

 

 

 

Input-

Address Strobe from Controller, sampled on the rising edge of CLK, active LOW. When

 

 

ADSC

 

 

 

 

 

 

 

 

 

 

 

Synchronous

asserted LOW, addresses presented to the device are captured in the address registers. A[1:0] are

 

 

 

 

 

 

 

 

 

 

 

 

also loaded into the burst counter. When ADSP and ADSC are both asserted, only ADSP is recog-

 

 

 

 

 

 

 

 

 

 

 

 

nized.

 

 

 

 

ZZ

Input-

ZZ “sleep” Input, active HIGH. When asserted HIGH places the device in a non-time-critical

 

 

 

 

 

 

 

 

 

 

 

Asynchronous

“sleep” condition with data integrity preserved. For normal operation, this pin has to be LOW or left

 

 

 

 

 

 

 

 

 

 

 

 

floating. The ZZ pin has an internal pull-down.

 

 

 

 

DQs

I/O-

Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered by

 

 

DQP[A:B]

Synchronous

the rising edge of CLK. As outputs, they deliver the data contained in the memory location specified

 

 

 

 

 

 

 

 

 

 

 

 

by the addresses presented during the previous clock rise of the read cycle. The direction of the

 

 

 

 

 

 

 

 

 

 

 

 

pins is controlled by OE. When OE is asserted LOW, the pins behave as outputs. When HIGH, DQs

 

 

 

 

 

 

 

 

 

 

 

 

and DQP[A:B] are placed in a tri-state condition.

 

 

 

 

VDD

Power Supply

Power supply inputs to the core of the device.

 

 

 

 

VSS

Ground

Ground for the core of the device.

 

 

 

 

VDDQ

I/O Power

Power supply for the I/O circuitry.

 

 

 

 

 

 

 

 

 

 

 

 

 

Supply

 

 

 

 

 

 

 

 

 

 

VSSQ

I/O Ground

Ground for the I/O circuitry.

 

 

 

 

MODE

Input-

Selects Burst Order. When tied to GND selects linear burst sequence. When tied to VDD or left

 

 

 

 

 

 

 

 

 

 

 

Static

floating selects interleaved burst sequence. This is a strap pin and should remain static during

 

 

 

 

 

 

 

 

 

 

 

 

device operation. Mode Pin has an internal pull-up.

 

 

 

 

NC

 

No Connects. Not internally connected to the die. 2M, 4M, 9M, 18M, 72M, 144M, 288M, 576M and

 

 

 

 

 

 

 

 

 

 

 

 

1G are address expansion pins and are not internally connected to the die.

 

 

Document #: 38-05665 Rev. *B

Page 4 of 16

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Contents Features Selection Guide Functional Description1166 MHz 133 MHz Unit Cypress Semiconductor CorporationFunctional Block Diagram CY7C1298HCY7C1298H Pin Configurations Pin TqfpTop View Pin Descriptions Functional Overview Sleep ModeBurst Sequences Interleaved ‘Burst Address Table Mode = Floating or VDD Linear Burst Address Table Mode = GNDFirst Second Third Fourth Address A1, A0Function ZZ Mode Electrical CharacteristicsParameter Description Test Conditions Min Max Unit Electrical Characteristics Over the Operating Range7,8 Maximum RatingsOperating Range Ambient RangeCapacitance9 Thermal Characteristics9AC Test Loads and Waveforms Switching Characteristics Over the Operating Range 14 Switching Waveforms Read Timing16Write Timing16 Address A1 A2Read/Write Timing16, 18 ZZ Mode Timing20 DON’T CareOrdering Information Package DiagramPin Tqfp 14 x 20 x 1.4 mm Issue Date Orig. Description of Change Document History