CY62148E MoBL®

Thermal Resistance [10]

Parameter

Description

Test Conditions

SOIC

TSOP II

Unit

Package

Package

 

 

 

 

 

 

 

 

 

 

ΘJA

Thermal Resistance

Still Air, soldered on a 3 × 4.5 inch,

75

77

°C/W

 

(Junction to Ambient)

two-layer printed circuit board

 

 

 

ΘJC

Thermal Resistance

 

10

13

°C/W

 

(Junction to Case)

 

 

 

 

AC Test Loads and Waveforms

R1

VCC

ALL INPUT PULSES

OUTPUT

30 pF

INCLUDING

JIG AND

SCOPE

 

 

3.0V

 

 

 

 

 

 

 

 

90%

R2

10%

 

 

 

 

 

 

 

 

 

 

 

 

 

 

GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Rise Time = 1 V/ns

 

 

 

 

 

 

 

Equivalent to:

THEVENIN EQUIVALENT

OUTPUT

 

 

 

RTH

 

 

 

 

V

 

 

 

 

 

 

 

90%

10%

Fall Time = 1 V/ns

Parameters

5.0V

Unit

R1

1800

 

 

 

R2

990

 

 

 

RTH

639

VTH

1.77

V

Data Retention Characteristics (Over the Operating Range)

 

Parameter

Description

 

 

Conditions

 

Min

Typ [3]

Max

Unit

VDR

VCC for Data Retention

 

 

 

 

2

 

 

V

ICCDR

Data Retention Current

VCC= VDR,

 

> VCC – 0.2V,

Ind’l/Auto-A

 

1

7

A

CE

 

 

 

VIN > VCC – 0.2V or VIN < 0.2V

 

 

 

 

 

tCDR [10]

Chip Deselect to Data Retention Time

 

 

 

 

0

 

 

ns

t

[11]

Operation Recovery Time

 

 

 

 

t

 

 

ns

 

R

 

 

 

 

 

RC

 

 

 

Data Retention Waveform

 

 

VCC(min)

DATA RETENTION MODE

VCC(min)

V

CC

V

> 2.0V

 

tCDR

DR

 

tR

 

 

 

 

CE

 

 

 

 

Note

11. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) > 100 s.

 

Document #: 38-05442 Rev. *F

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Cypress CY62148E Thermal Resistance, AC Test Loads and Waveforms, Data Retention Characteristics Over the Operating Range