CY62157EV30 MoBL®

Maximum Ratings

Exceeding maximum ratings may shorten the battery life of the device. User guidelines are not tested.

Storage Temperature

–65°C to + 150°C

Ambient Temperature with

 

 

 

 

Power Applied

–55°C to + 125°C

Supply Voltage to Ground

 

 

 

 

Potential

–0.3V to 3.9V

(VCCmax + 0.3V)

DC Voltage Applied to Outputs

 

 

 

in High-Z State [6, 7]

–0.3V to 3.9V

(V

CCmax

+ 0.3V)

 

 

 

 

DC Input Voltage [6, 7]

–0.3V to 3.9V (V

 

+ 0.3V)

 

 

 

CC max

 

 

Output Current into Outputs (LOW)

 

20 mA

Static Discharge Voltage

 

> 2001V

(MIL-STD-883, Method 3015)

 

 

 

Latch up Current

 

 

 

> 200 mA

Operating Range

 

 

 

 

 

 

 

 

 

 

 

 

Device

Range

 

Ambient

VCC

[8]

 

Temperature

 

CY62157EV30LL

Ind’l/Auto-A

–40°C to +85°C

2.20V to

 

 

 

 

3.60V

Electrical Characteristics

Over the Operating Range

Parameter

Description

 

 

Test Conditions

45 ns (Ind’l/Auto-A)

Unit

 

 

 

 

 

 

 

Min

Typ [2]

Max

 

 

 

 

 

 

 

 

 

VOH

Output HIGH Voltage

IOH = –0.1 mA

 

 

 

2.0

 

 

V

 

 

 

IOH = –1.0 mA, VCC > 2.70V

2.4

 

 

V

VOL

Output LOW Voltage

IOL = 0.1 mA

 

 

 

 

 

0.4

V

 

 

 

IOL = 2.1mA, VCC > 2.70V

 

 

0.4

V

VIH

Input HIGH Voltage

 

VCC = 2.2V to 2.7V

 

 

 

1.8

 

VCC + 0.3

V

 

 

 

VCC = 2.7V to 3.6V

 

 

 

2.2

 

VCC + 0.3

V

VIL

Input LOW Voltage

 

VCC = 2.2V to 2.7V

 

 

 

–0.3

 

0.6

V

 

 

 

VCC = 2.7V to 3.6V

 

 

 

–0.3

 

0.8

V

IIX

Input Leakage Current

GND < VI < VCC

 

 

 

–1

 

+1

A

IOZ

Output Leakage Current

GND < VO < VCC, Output Disabled

–1

 

+1

A

ICC

VCC Operating Supply Current

f = fmax = 1/tRC

VCC = VCCmax

 

18

25

mA

 

 

 

f = 1 MHz

IOUT = 0 mA

 

1.8

3

 

 

 

 

 

CMOS levels

 

 

 

 

ISB1

Automatic CE Power Down

 

 

1 > VCC 0.2V, CE2 < 0.2V

 

2

8

A

 

CE

 

 

Current — CMOS Inputs

 

VIN > VCC – 0.2V, VIN < 0.2V)

 

 

 

 

 

 

 

f = fmax (Address and Data Only),

 

 

 

 

 

 

 

f = 0 (OE, BHE, BLE and

 

 

 

 

 

 

 

 

 

WE), VCC = 3.60V

 

 

 

 

ISB2 [9]

Automatic CE Power Down

 

 

1 > VCC – 0.2V or CE2 < 0.2V,

 

2

8

A

 

CE

 

 

Current — CMOS Inputs

 

VIN > VCC – 0.2V or VIN < 0.2V, f = 0, VCC = 3.60V

 

 

 

 

Capacitance [10]

Parameter

Description

Test Conditions

Max

Unit

 

 

 

 

 

CIN

Input Capacitance

TA = 25°C, f = 1 MHz,

10

pF

 

 

VCC = VCC(typ)

 

 

COUT

Output Capacitance

10

pF

 

Notes

6.VIL(min) = –2.0V for pulse durations less than 20 ns.

7.VIH(max) = VCC + 0.75V for pulse durations less than 20 ns.

8.Full device AC operation assumes a 100 s ramp time from 0 to Vcc(min) and 200 s wait time after VCC stabilization.

9.Only chip enables (CE1 and CE2), byte enables (BHE and BLE) and BYTE (48 TSOP I only) need to be tied to CMOS levels to meet the ISB2 / ICCDR spec. Other inputs can be left floating.

10.Tested initially and after any design or process changes that may affect these parameters.

Document #: 38-05445 Rev. *E

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Cypress CY62157EV30 manual Maximum Ratings, Operating Range, Electrical Characteristics, Capacitance