1594A/1595A Super-Thermometer
Main Menu
48
When the User Settings screen appears after power-on, when the Start-Up Help setting is ON, the User Set-
tings screen includes function key NEXT (F1). This key leads to the Time and Date Settings screen (see Sec-
tion 5.7.5.1, TIME DATE (F1), on page 50), where the clock may be set to the local time.
5.7.4.2 FIELD SETTINGS (F2)
MAIN MENU | DISPLAY MENU |
The Field Settings function key is used for selecting statistical elds to display in the Measurement Screen. A
particular set of statistical elds can be stored as a set and recalled using the RECALL MEMORY selection.
Four different sets can be stored in Recall Memory, any of which can be restored to factory defaults using the
RESTORE DEFAULT (F1) function key (see Default Statistical Fields table below). Restore Default only af-
fects the Recall Memory selection that is currently display.
Individual statistical elds in any of the Recall Memory sets can be changed by rst selecting the RECALL
MEMORY set number, pressing the ENTER key, arrowing down to the eld to be changed, changing the eld
with the Left/Right arrow keys and pressing the ENTER key save the change. The available data eld options
and their descriptions are listed in the tables below.
Table 15 Default Statistical Fields
Field Memory 1 Memory 2 Memory 3 Memory 4
1 MEAN MEAN MAXIMUM MEAN
2 STD DEV STD DEV MINIMUM STD DEV
3 SE OF MEAN N DELTA TIME
4 RESISTANCE RESISTANCE RESISTANCE D AT E
Table 16 Statistical Field Descriptions
Option Description Equation
MEAN arithmetic mean of measurements Mean ny
i
n
i
=
=
∑
1
1
STD DEV sample standard deviation of measurements StdDev nynMean
i
i
n
=−−•
=
∑
1
1
2
1
2
SE OF MEAN standard error (estimated standard deviation) of the
mean SE of Mean stddev
n
=
()
MAXIMUM maximum measurement
MINIMUM minimum measurement
SPREAD difference between maximum and minimum SpreadMaximum Minimum
=−
N number of measurements (sample size)
DELTA difference relative to a delta channel or offset
RESISTANCE resistance measurement
RATIO resistance ratio measurement
TIME time from the system clock
DAT E date from the system clock
As a note of further explanation, SE OF MEAN provides an estimate of the uncertainty (k = 1) of the MEAN
value. SE OF MEAN is calculated from the sample standard deviation of unltered measurements (not the
same as the displayed standard deviation of ltered measurements) and the sample size. The method used to
calculate SE OF MEAN disregards the effect of the digital lter since it causes correlation among displayed
measurements. Otherwise the result of the formula for SE OF MEAN would produce an erroneously low
value.