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| PRELIMINARY | CY14B101Q2 | ||||
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| CY14B101Q3 | |||||
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Data Retention and Endurance |
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Parameter |
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| Description | Min |
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DATAR | Data Retention |
| 20 |
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NVC | Nonvolatile STORE Operations | 200 |
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Capacitance |
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Parameter[6] | Description | Test Conditions | Max |
| Unit | ||||
CIN | Input Capacitance | TA = 25°C, f = 1MHz, | 6 |
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COUT | Output Pin Capacitance | 8 |
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Thermal Resistance |
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Parameter [6] | Description | Test Conditions |
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ΘJA | Thermal Resistance | Test conditions follow standard test | TBD |
| TBD | °C/W | |||
| (Junction to Ambient) | methods and procedures for measuring |
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| thermal impedance, per EIA / JESD51. |
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ΘJC | Thermal Resistance | TBD |
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| (Junction to Case) |
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| Figure 20. AC Test Loads and Waveforms |
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577Ω |
3.0V |
R1 |
OUTPUT |
30 pF
| 3.0V |
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R2 | 5 pF |
789Ω
577Ω
R1
R2 789Ω
AC Test Conditions
Input Pulse Levels | 0V to 3V |
Input Rise and Fall Times (10% - 90%) | <3 ns |
Input and Output Timing Reference Levels | 1.5V |
Note
6. These parameters are guaranteed by design and are not tested.
Document #: | Page 14 of 22 |
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