Cypress CY62148E manual Thermal Resistance, AC Test Loads and Waveforms, Data Retention Waveform

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CY62148E MoBL®

Thermal Resistance [10]

Parameter

Description

Test Conditions

SOIC

TSOP II

Unit

Package

Package

 

 

 

 

 

 

 

 

 

 

ΘJA

Thermal Resistance

Still Air, soldered on a 3 × 4.5 inch,

75

77

°C/W

 

(Junction to Ambient)

two-layer printed circuit board

 

 

 

ΘJC

Thermal Resistance

 

10

13

°C/W

 

(Junction to Case)

 

 

 

 

AC Test Loads and Waveforms

R1

VCC

ALL INPUT PULSES

OUTPUT

30 pF

INCLUDING

JIG AND

SCOPE

 

 

3.0V

 

 

 

 

 

 

 

 

90%

R2

10%

 

 

 

 

 

 

 

 

 

 

 

 

 

 

GND

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Rise Time = 1 V/ns

 

 

 

 

 

 

 

Equivalent to:

THEVENIN EQUIVALENT

OUTPUT

 

 

 

RTH

 

 

 

 

V

 

 

 

 

 

 

 

90%

10%

Fall Time = 1 V/ns

Parameters

5.0V

Unit

R1

1800

 

 

 

R2

990

 

 

 

RTH

639

VTH

1.77

V

Data Retention Characteristics (Over the Operating Range)

 

Parameter

Description

 

 

Conditions

 

Min

Typ [3]

Max

Unit

VDR

VCC for Data Retention

 

 

 

 

2

 

 

V

ICCDR

Data Retention Current

VCC= VDR,

 

> VCC – 0.2V,

Ind’l/Auto-A

 

1

7

A

CE

 

 

 

VIN > VCC – 0.2V or VIN < 0.2V

 

 

 

 

 

tCDR [10]

Chip Deselect to Data Retention Time

 

 

 

 

0

 

 

ns

t

[11]

Operation Recovery Time

 

 

 

 

t

 

 

ns

 

R

 

 

 

 

 

RC

 

 

 

Data Retention Waveform

 

 

VCC(min)

DATA RETENTION MODE

VCC(min)

V

CC

V

> 2.0V

 

tCDR

DR

 

tR

 

 

 

 

CE

 

 

 

 

Note

11. Full device operation requires linear VCC ramp from VDR to VCC(min) > 100 s or stable at VCC(min) > 100 s.

 

Document #: 38-05442 Rev. *F

Page 4 of 10

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Contents Features Product Portfolio Functional DescriptionTsop SoicPin Configuration 2 Logic Block DiagramPin SOIC/TSOP II Pinout Top View Maximum Ratings Electrical Characteristics Over the Operating RangeOperating Range Data Retention Characteristics Over the Operating Range Thermal ResistanceAC Test Loads and Waveforms Data Retention WaveformRead Cycle Parameter Description 45 ns 55 ns Unit MinWrite Cycle Switching Waveforms Read Cycle No Address Transition Controlled 16Read Cycle No OE Controlled 17 Write Cycle No WE Controlled, OE High During Write 19IO’s Mode Power Truth TableWrite Cycle No CE Controlled 19 Write Cycle No WE Controlled, OE LOWPackage Diagrams Ordering InformationPin 450 MIL Molded Soic Document History Document Title CY62148E MoBL , 4-Mbit 512K x 8 Static RAMDocument Number REV ECN no