Agilent Technologies 5962-8200 Specific Troubleshooting Procedures, Power-on Self-test Failures

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Troubleshooting - 3

Specific Troubleshooting Procedures

Power-on Self-test Failures

The power-on self-test sequence tests most of the digital and DAC circuits. If the supply fails self-test, the display "ERR" annunciator will come on. You can then query the unit to find out what the error(s) are. When an error is detected, the output is not disabled so you can still attempt to program the supply to help troubleshoot the unit. Table 3-2 lists the self test errors and gives the probable cause for each error.

NOTE: A partial self test is performed when the *TST? query is executed. Those tests that interfere with normal interface operation or cause the output to change are not performed by *TST?. The return value of *TST? will be zero if all tests pass, or the error code of the first test that failed. The power supply will continue normal operation if *TST? returns a non-zero value.

Table 3-2. Self-Test Error Codes/Messages

Error Code

Description

Probable Cause

E1

Checksum in Read-only Non-volatile ROM

A2 Interface Bd

E2

Checksum in Config Non-volatile ROM

A2 Interface Bd

E3

Checksum in Cal Non-volatile ROM

A2 Interface Bd

E4

Checksum in State Non-volatile ROM

A2 Interface Bd

E5

Checksum in RST Non-volatile ROM

A2 Interface Bd

E10

RAM test failed

A2 Interface Bd

E11

12 bit DAC test failed, 0 is written to DAC U241A and B,

A2

Interface Bd

 

ADC U242 is checked for 133 +/- 7 counts

 

 

E12

12 bit DAC test failed, 4095 is written to DAC U241A

A2

Interface Bd

 

and 0 to B, ADC U242 is checked for 71 +/- 7 counts

 

 

E13

12 bit DAC test failed, 0 is written to DAC U241A and

A2

Interface Bd

 

4095 to B, ADC U242 is checked for 71 +/- 7 counts

 

 

E14

12 bit DAC test failed, 4095 is written to DAC U241A

A2

Interface Bd

 

and B, ADC U242 is checked for 10 +/- 7 counts

 

 

E15

8 bit DAC test failed, 10 and 240 are written to DAC

A2

Interface Bd

 

U244, ADC U242 is checked for 10 and 240 +/- 7 counts

 

 

E80

Dig I/O test failed, SEC_PCLR written low and high,

A2

Interface Bd

 

read back through Xilinx

 

 

E213

RS-232 input buffer overrun

A2

Interface Bd

E216

RS-232 framing error

A2

Interface Bd

E217

RS-232 parity error

A2

Interface Bd

E218

RS-232 UART input overrun

A2

Interface Bd

E220

Front Panel comm UART input overrun

A3

Front Panel/Display Bd

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Contents Agilent Part No Microfiche No September Certification Warranty InformationBefore Applying Power Safety SummarySymbol Description Safety Symbol DefinitionsInstrument Identification Printing HistoryTable of Contents Disassembly Procedures Initialization ROM UpgradePost-repair Calibration IntroductionPage Organization Safety ConsiderationsRelated Documents ChapterElectrostatic Discharge RevisionsManual Revisions Firmware RevisionsTest Equipment Required IntroductionTest Setup Type Specifications Recommended ModelMeasurement Techniques Electronic Load Test SetupPerformance Tests Operation Verification TestsCurrent-Monitoring Resistor ProgrammingConstant Voltage CV Tests CV SetupVoltage Programming and Readback Accuracy CV Load EffectTransient Recovery Time CV Source EffectCV Noise Pard CC Setup Constant Current CC TestsCurrent Programming and Readback Accuracy Low Range Current Readback Accuracy Current Sink -CC OperationCC Load Effect CC Load and Line RegulationCC Noise Pard CC Source EffectPerformance Test Equipment Form Transient Response Load Effect Source Effect Pard Ripple and NoiseConstant Current Tests Current Programming and Readback Current Sink @ -3A Readback MA Range Current ReadbackLoad Effect Vout − Vout + 2.0mV Vout −Source Effect Vout − Iout −Iout − Iout + 0.2 mA Vout + 4 mVIout − Iout + 2.2 mA Current Sink @ -0.6A Readback Iout −Iout − Iout + 0.1 mA Load Effect Vout − Vout + 5 mVIout − Iout + 1.1 mA Current Sink @ -0.3A Readback Iout −Page Troubleshooting Flow Charts Overall TroubleshootingTest Equipment Required for Troubleshooting Type Purpose Recommended ModelSheet 1. Troubleshooting Flowchart Sheet 2. Troubleshooting Flowchart Sheet 3. Troubleshooting Flowchart Sheet 4. Troubleshooting Flowchart Power-on Self-test Failures Specific Troubleshooting ProceduresSelf-Test Error Codes/Messages Error Code Description Probable CauseBias and Reference Supplies CV/CC Status Annunciators TroubleshootingBias and Reference Voltages Bias Test Point MeasurementVoltage Measurements at J207 A2 Interface to A1 Main board J307 Voltage MeasurementsManual Fan Speed Control Disabling Protection FeaturesInhibit Calibration Switch Calibration PasswordPost-repair Calibration Upgrade Procedure ROM UpgradeInitialization Identifying the FirmwareList of Required Tools Disassembly ProceduresCover, Removal and Replacement A2 Interface Board, Removal and ReplacementFront Panel Assembly, Removal and Replacement A3 Front Panel Board, Removal and Replacement T1 Power Transformer, Removal and ReplacementA1 Main Control Board Line Voltage Wiring Interface Signals Power Supply Interface signalsConnector Signal Description A2 Interface Circuits A3 Front Panel CircuitsPrimary Interface Secondary InterfaceA1 Main Board Circuits Power CircuitsControl Circuits Principles of Operation Page Designator PartNumber Qty Description Chassis, ElectricalReplaceable Parts List Mechanical Parts Identification MP9 Chassis, MechanicalDiagrams Diagrams A2/A3 Boards Block Diagram Circuits BiasIndex Index