Test set upgrades

A single 8510 network analyzer can be configured to control up to four test sets. The operator can switch between test sets, without reconnections, using front panel controls. This arrangement is often referred to as the multiple test set configuration. Each test set must be equipped with Option 001 for IF switching. Other requirements may apply for RF/LO switching.

For more details, please refer to product note 8510-14, Using Multiple Test Sets with the Agilent 8510C (literature number 5967-5886E).

Agilent 8511A K01 or 08511-60008Retrofits IF switching (Option 001) to any 8510 test set for multiple test set operations.

Expanding measurement capabilities

Adding pulse capabilities (Option 008)

To perform pulse measurements, the 8510 network analyzer must be retrofitted with Option 008. The measurement system must include either the 85110L (0.045 to 2 GHz) or 85110A (2 to 20 GHz) pulsed-RF S-parameter test set and two synthesizers (high power synthesizers may apply).

The 85110L requires an 83620B synthesizer with Options 001/004/008/H80 (for RF) and an 83620B with Options 004/008/H80 (for LO)

The 85110A requires an 83622B synthesizer with Options 001/004/008 (for RF) and an 83623L with Options 004/008 (for LO)

Agilent 85111B Adds pulsed-RF measurement capability (Option 008) to the 8510C by adding new circuitry and includes on-site installation by an Customer Engineer (where available). To perform pulsed-RF measurements, the 8510 with Option 008 must be used with either the 85110L or 85110A Pulsed-RF S-parameter test set. Other requirements may apply.

Adding time domain capabilities

With the time domain option, data from transmission or reflection measure- ments are converted from the frequency domain to the time domain via the inverse Fourier transform. The time domain data are presented on the CRT display showing the measured parameter value versus time.

Agilent 85012C Adds time domain (Option 010) to an 8510C (customer installed).

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Agilent Technologies 8510XF manual Test set upgrades, Expanding measurement capabilities, Adding pulse capabilities Option