PRELIMINARY

CY14B108K, CY14B108M

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Retention and Endurance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

Description

Min

 

 

Unit

 

 

 

DATAR

Data Retention

20

 

 

Years

 

 

 

NVC

Nonvolatile STORE Operations

200

 

 

K

 

 

 

Capacitance

 

 

 

 

 

 

 

 

 

 

 

In the following table, the capacitance parameters are listed. [13]

 

 

 

 

 

 

 

Parameter

 

 

Description

Test Conditions

 

Max

 

Unit

 

 

CIN

Input Capacitance

TA = 25°C, f = 1 MHz,

 

14

 

 

pF

 

 

 

 

VCC = 0 to 3.0V

 

 

 

 

 

 

COUT

Output Capacitance

 

14

 

 

pF

 

 

Thermal Resistance

 

 

 

 

 

 

 

 

In the following table, the thermal resistance parameters are listed.[13]

 

 

 

 

 

 

 

Parameter

 

 

Description

Test Conditions

 

44 TSOP II

54 TSOP II

Unit

 

 

ΘJA

Thermal Resistance

Test conditions follow standard test

31.11

30.73

°C/W

 

 

 

(Junction to Ambient)

methods and procedures for

 

 

 

 

 

 

 

 

 

 

 

measuring thermal impedance, in

 

 

 

 

 

 

ΘJC

Thermal Resistance

5.56

6.08

°C/W

 

 

accordance with EIA/JESD51.

 

 

(Junction to Case)

 

 

 

 

 

 

 

 

 

 

 

Figure 6. AC Test Loads

 

 

 

 

 

 

 

3.0V

577Ω

3.0V

R1

 

OUTPUT

OUTPUT

 

30 pF

R2

5 pF

 

789Ω

 

577Ω

R1

R2 789Ω

AC Test Conditions

Input Pulse Levels

0V to 3V

Input Rise and Fall Times (10% - 90%)

<3 ns

Input and Output Timing Reference Levels

1.5V

Note

13. These parameters are only guaranteed by design and are not tested.

Document #: 001-47378 Rev. **

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Cypress CY14B108K, CY14B108M manual Data Retention and Endurance, Capacitance, Thermal Resistance, AC Test Conditions