CY62157CV30/33
Document #: 38-05014 Rev. *F Page 5 of 13
Capacitance[7]
Parameter Description Test Conditions Max. Unit
CIN Input Capacitance TA = 25°C, f = 1 MHz,
VCC = VCC(typ.)
6pF
COUT Output Capacitance 8 pF

AC Test Loads and Waveforms

V
CC
Typ
V
CC
OUTPUT
R2
30 pF
INCLUDING
JIG AND
SCOPE
GND
90%
10% 90%
10%
OUTPUT V
TH
Equivalent to: THÉVENIN EQUIVALENT
ALL INPUT PULSES
R
TH
R1
Rise TIme: 1 V/ns Fall Time: 1 V/ns
Parameters 3.0V 3.3V Unit
R1 1.105 1.216 ΚΩ
R2 1.550 1.374 ΚΩ
RTH 0.645 0.645 ΚΩ
VTH 1.75 1.75 V
Data Retention Characteristics (Over the Operating Range)
Parameter Description Conditions Min. Typ.[2] Max. Unit
VDR VCC for Data Retention 1.5 V
ICCDR Data Retention Current VCC = 1.5V, CE1 > VCC – 0.2V or
CE2 < 0.2V,
VIN > VCC – 0.2V or VIN < 0.2V
Auto-A 4 20 µA
Auto-E 460µA
tCDR[8] Chip Deselect to Data
Retention Time 0ns
tR[8] Operation Recovery Time tRC ns
Data Retention Waveform[9]
Notes:
8. Full Device AC operation requires linear VCC ramp from VDR to VCC(min.) > 100 µs or stable at VCC(min.) >100 µs.
9. BHE.BLE is the AND of both BHE and BLE. Chip can be deselected by either disabling the chip enable signals or by disabling both BHE and BLE.
V
CC(min.)
V
CC(min.)
t
CDR
V
DR
>1.5 V
DATA RETENTION MODE
t
R
CE
1
or
V
CC
BHE.BLE
CE
2
or
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