Cypress STK12C68-5 STK12C68-5 (SMD5962-94599)

STK12C68-5 (SMD5962-94599)
Document Number: 001-51026 Rev. ** Page 8 of 18
Data Retention and Endurance
Parameter Description Min Unit
DATARData Retention 100 Years
NVCNonvolatile STORE Operations 1,000 K
Capacitance
In the following table, the capacitance parameters are listed.[6]
Parameter Description Test Conditions Max Unit
CIN Input Capacitance TA = 25°C, f = 1 MHz,
VCC = 0 to 3.0 V 8pF
COUT Output Capacitance 7pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[6]
Parameter Description Test Conditions 28-CDIP 28-LCC Unit
ΘJA Thermal Resistance
(Junction to Ambient) Test conditions follow standard test methods and procedures for measuring thermal impedance, per
EIA / JESD51.
TBD TBD °C/W
ΘJC Thermal Resistance
(Junction to Case) TBD TBD °C/W
Figure 7. AC Test Loads
AC Test Conditions
5.0V
Output
30 pF
R1 963Ω
R2
512Ω
5.0V
Output
5 pF
R1 963
Ω
R2
512 Ω
For Tri-state Specs
Input Pulse Levels....................................................0V to 3V
Input Rise and Fall Times (10% to 90%)...................... <5 ns
Input and Output Timing Reference Levels.......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
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