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Data Retention and Endurance |
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Parameter | Description | Min |
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DATAR | Data Retention | 100 |
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NVC | Nonvolatile STORE Operations | 1,000 |
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Capacitance |
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In the following table, the capacitance parameters are listed.[6] |
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Parameter | Description | Test Conditions |
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CIN | Input Capacitance | TA = 25°C, f = 1 MHz, |
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| 8 |
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| VCC = 0 to 3.0 V |
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COUT | Output Capacitance |
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Thermal Resistance |
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In the following table, the thermal resistance parameters are listed.[6] |
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Parameter | Description | Test Conditions |
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ΘJA | Thermal Resistance | Test conditions follow standard test methods and | TBD | TBD |
| °C/W |
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ΘJC | Thermal Resistance | TBD | TBD |
| °C/W |
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| Figure 7. AC Test Loads |
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| R1 963Ω | R1 963Ω For | ||||||
5.0V |
Output |
30 pF |
| R2 |
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512Ω
5.0V |
Output |
5 pF |
| R2 |
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512Ω
AC Test Conditions
Input Pulse Levels | 0V to 3V |
Input Rise and Fall Times (10% to 90%) | <5 ns |
Input and Output Timing Reference Levels | 1.5 |
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: | Page 8 of 18 |
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