Cypress CY7C1177V18 manual TAP Controller State Diagram, Shows the tap controller state diagram

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CY7C1166V18, CY7C1177V18

CY7C1168V18, CY7C1170V18

TAP Controller State Diagram

Figure 2 shows the tap controller state diagram. [9]

Figure 2. Tap Controller State Diagram

1

0

TEST-LOGIC RESET

0

TEST-LOGIC/ IDLE

1

SELECT

 

1

SELECT

 

1

 

 

 

 

DR-SCAN

 

 

IR-SCAN

 

 

0

 

 

0

 

 

 

1

 

 

1

 

 

 

CAPTURE-DR

 

CAPTURE-IR

 

 

0

 

 

0

 

 

 

SHIFT-DR

 

0

SHIFT-IR

 

0

 

1

 

 

1

 

 

 

EXIT1-DR

 

1

EXIT1-IR

 

1

 

 

 

 

 

 

0

 

 

0

 

 

 

PAUSE-DR

0

PAUSE-IR

 

0

 

1

 

 

1

 

 

 

0

 

 

0

 

 

 

EXIT2-DR

 

 

EXIT2-IR

 

 

 

1

 

 

1

 

 

 

UPDATE-DR

 

UPDATE-IR

 

 

1

0

 

1

0

 

 

 

 

 

 

Note

9. The 0/1 next to each state represents the value at TMS at the rising edge of TCK.

Document Number: 001-06620 Rev. *D

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Contents Selection Guide Functional Description FeaturesConfigurations Description 400 MHz 375 MHz 333 MHz 300 MHz UnitLogic Block Diagram CY7C1166V18 Logic Block Diagram CY7C1177V18Logic Block Diagram CY7C1168V18 Logic Block Diagram CY7C1170V18CY7C1177V18 2M x Pin ConfigurationsCY7C1166V18 2M x TMSBWS CY7C1168V18 1M xCY7C1170V18 512K x TMS TDISynchronous Read/Write Input. When Pin DefinitionsPin Name Pin Description Negative Input Clock InputTDO for Jtag Power Supply Inputs to the Core of the DevicePower Supply Inputs for the Outputs of the Device TCK Pin for JtagFunctional Overview Master Truth TableSRAM#1 SRAM#2 OperationRemains unaltered Write Cycle DescriptionsComments During the Data portion of a write sequenceInto the device. D359 remains unaltered Write cycle descriptions of CY7C1170V18 followsDevice Device. D80 and D3518 remains unalteredIeee 1149.1 Serial Boundary Scan Jtag Idcode TAP Controller State Diagram Shows the tap controller state diagramTAP Controller TAP Controller Block DiagramTAP Electrical Characteristics Parameter Description Test Conditions Min Max UnitTAP AC Switching Characteristics TAP Timing and Test ConditionInstruction Codes Identification Register DefinitionsScan Register Sizes Boundary Scan Order Bit # Bump IDPower Up Waveforms Power Up Sequence in DDR-II+ SramPower Up Sequence DLL ConstraintsOperating Range Electrical CharacteristicMaximum Ratings AC Input RequirementsAC Test Loads and Waveforms CapacitanceThermal Resistance Parameter Description Test Conditions Max UnitLOW Parameter Min MaxHigh DLL TimingNOP Switching WaveformRead/Write/Deselect Sequence Ordering Information 333 Package Diagram Ball Fbga 13 x 15 x 1.4 mmNXR ECN No Issue Date Orig. Description of ChangeDocument History VKN/KKVTMP