Cypress CY7C1166V18 manual Features, Configurations, Selection Guide Functional Description

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CY7C1166V18, CY7C1177V18

CY7C1168V18, CY7C1170V18

18-Mbit DDR-II+ SRAM 2-Word Burst Architecture (2.5 Cycle Read Latency)

Features

18 Mbit density (2M x 8, 2M x 9, 1M x 18, 512K x 36)

300 MHz to 400 MHz clock for high bandwidth

2-Word burst for reducing address bus frequency

Double Data Rate (DDR) interfaces

(data transferred at 800 MHz) at 400 MHz

Read latency of 2.5 clock cycles

Two input clocks (K and K) for precise DDR timing SRAM uses rising edges only

Echo clocks (CQ and CQ) simplify data capture in high-speed systems

Data valid pin (QVLD) to indicate valid data on the output

Synchronous internally self-timed writes

Core VDD = 1.8V ± 0.1V; IO VDDQ = 1.4V to VDD[1]

HSTL inputs and Variable drive HSTL output buffers

Available in 165-Ball FBGA package (13 x 15 x 1.4 mm)

Offered in both Pb-free and non Pb-free packages

JTAG 1149.1-compatible test access port

Delay Lock Loop (DLL) for accurate data placement

Configurations

With Read Cycle Latency of 2.5 cycles:

CY7C1166V18 – 2M x 8

CY7C1177V18 – 2M x 9

CY7C1168V18 – 1M x 18

CY7C1170V18 – 512K x 36

Selection Guide

Functional Description

The CY7C1166V18, CY7C1177V18, CY7C1168V18, and CY7C1170V18 are 1.8V Synchronous Pipelined SRAMs equipped with DDR-II+ architecture. The DDR-II+ consists of an SRAM core with an advanced synchronous peripheral circuitry. Addresses for read and write are latched on alternate rising edges of the input (K) clock. Write data is registered on the rising edges of both K and K. Read data is driven on the rising edges of K and K. Each address location is associated with two 8-bit words (CY7C1166V18), or 9-bit words (CY7C1177V18), or 18-bit words (CY7C1168V18), or 36-bit words (CY7C1170V18) that burst sequentially into or out of the device.

Asynchronous inputs include output impedance matching input (ZQ). Synchronous data outputs (Q, sharing the same physical pins as the data inputs D) are tightly matched to the two output echo clocks CQ/CQ, eliminating the need for separately capturing data from each individual DDR SRAM in the system design.

All synchronous inputs pass through input registers controlled by the K or K input clocks. All data outputs pass through output registers controlled by the K or K input clocks. Writes are conducted with on-chip synchronous self-timed write circuitry.

Description

400 MHz

375 MHz

333 MHz

300 MHz

Unit

Maximum Operating Frequency

400

375

333

300

MHz

 

 

 

 

 

 

Maximum Operating Current

1080

1020

920

850

mA

 

 

 

 

 

 

Note

1.The QDR consortium specification for VDDQ is 1.5V + 0.1V. The Cypress QDR devices exceed the QDR consortium specification and are capable of supporting VDDQ = 1.4V to VDD.

Cypress Semiconductor Corporation • 198 Champion Court

San Jose, CA 95134-1709

408-943-2600

Document Number: 001-06620 Rev. *D

 

Revised March 06, 2008

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Contents Configurations FeaturesSelection Guide Functional Description Description 400 MHz 375 MHz 333 MHz 300 MHz UnitLogic Block Diagram CY7C1177V18 Logic Block Diagram CY7C1166V18Logic Block Diagram CY7C1170V18 Logic Block Diagram CY7C1168V18CY7C1166V18 2M x Pin ConfigurationsCY7C1177V18 2M x TMSCY7C1170V18 512K x CY7C1168V18 1M xBWS TMS TDIPin Name Pin Description Pin DefinitionsSynchronous Read/Write Input. When Negative Input Clock InputPower Supply Inputs for the Outputs of the Device Power Supply Inputs to the Core of the DeviceTDO for Jtag TCK Pin for JtagFunctional Overview SRAM#1 SRAM#2 Truth TableMaster OperationComments Write Cycle DescriptionsRemains unaltered During the Data portion of a write sequenceDevice Write cycle descriptions of CY7C1170V18 followsInto the device. D359 remains unaltered Device. D80 and D3518 remains unalteredIeee 1149.1 Serial Boundary Scan Jtag Idcode Shows the tap controller state diagram TAP Controller State DiagramTAP Electrical Characteristics TAP Controller Block DiagramTAP Controller Parameter Description Test Conditions Min Max UnitTAP Timing and Test Condition TAP AC Switching CharacteristicsScan Register Sizes Identification Register DefinitionsInstruction Codes Bit # Bump ID Boundary Scan OrderPower Up Sequence Power Up Sequence in DDR-II+ SramPower Up Waveforms DLL ConstraintsMaximum Ratings Electrical CharacteristicOperating Range AC Input RequirementsThermal Resistance CapacitanceAC Test Loads and Waveforms Parameter Description Test Conditions Max UnitHigh Parameter Min MaxLOW DLL TimingRead/Write/Deselect Sequence Switching WaveformNOP Ordering Information 333 Ball Fbga 13 x 15 x 1.4 mm Package DiagramDocument History ECN No Issue Date Orig. Description of ChangeNXR VKN/KKVTMP