Sony HCD-C5 service manual Basic Operations of the Test Mode, Selecting the Test Mode, Enter/Yes R

HCD-C5

4. BASIC OPERATIONS OF THE TEST MODE

All operations are performed using the . “R”,

The functions of these buttons are as follows.

>“R”,

ENTER/YES “R”and

MENU/NO “R”.

	Function name					Function
	,				buttons	Changes parameters and modes
. “R”		> “R”
				button		Proceeds onto the next step. Finalizes input
ENTER/YES “R”
			button			Returns to previous step. Stops operations
MENU/NO “R”

5. SELECTING THE TEST MODE

There are 26 types of test modes as shown below. The groups can be switched by pressing the . “R”or > “R”button. After selecting the group to be used, press the ENTER/YES “R”button. After setting a certain group, pressing the . “R”or

>“R”button switches modes shown below.

Refer to “Group” in the table for details can be selected.

All items used for servicing can be treated using group [Service]. So be carefully not to enter other groups by mistake.

Note: Do not use the test mode in the [Develop] group. If used, the unit may not operate normally.

If the [Develop] group is set accidentally, press the

MENU/NO “R”button immediately to exit the [Develop] group.

			Group
Display	No.	Details	Mark	Service
			Check
AUTO CHECK	C01	Automatic self-diagnosis
Err Display	C02	Error history display, clear
TEMP ADJUST	C03	Temperature compensation offset adjustment
LDPWR ADJUST	C04	Laser power adjustment
Iop Write	C05	Iop data writing
Iop NV Save	C06	Writes current Iop value in read nonvolatile memory using microprocessor
EF MO ADJUST	C07	Traverse (MO) adjustment
EF CD ADJUST	C08	Traverse (CD) adjustment
FBIAS ADJUST	C09	Focus bias adjustment
AG Set (MO)	C10	Auto gain output level adjustment (MO)
AG Set (CD)	C11	Auto gain output level adjustment (CD)
TEMP CHECK	C12	Temperature compensation offset check
LDPWR CHECK	C13	Laser power check
EF MO CHECK	C14	Traverse (MO) check
EF CD CHECK	C15	Traverse (CD) check
FBIAS CHECK	C16	Focus bias check
ScurveCHECK	C17	S-curve check
VERIFYMODE	C18	Nonvolatile memory check
DETRK CHECK	C19	Detrack check
0920 CHECK	C25	Most circumference check
Iop Read	C26	Iop data display
Iop Compare	C27	Comparison with initial Iop value written in nonvolatile memory
ADJ CLEAR	C28	Initialization of nonvolatile memory for adjustment values
INFORMATION	C31	Display of microprocessor version, etc.
CPLAY1MODE	C34	Continuous playback mode
CREC 1MODE	C35	Continuous recording mode

•For details of each adjustment mode, refer to “5. Electrical Adjustments”. For details of “Err Display”, refer to “Self-Diagnosis Function” on page 2.

•If a different mode has been selected by mistake, press the MENU/NO “R”button to release that mode.

•Modes with (⋅ ) in the Mark column are not used for servicing and therefore are not described in detail. If these modes are set accidentally, press the MENU/NO “R”button to release the mode immediately.

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