2Installing the System

Precautions for Performing Floating-Ground Measurements

IC- CAP measurements can be performed with the device in a

floating- ground configuration. This prevents ground- loop noise and, in the case of a bipolar junction transistor, damage to the device under test.

A floating- ground configuration is created by removing the shorting bar that connects the CIRCUIT COMMON and CHASSIS GROUND terminals.

WA R N I N G

A potential shock hazard exists when the shorting bar is disconnected for

floating-ground measurements. Do not touch any of the DC subsystem rear

 

 

panel connectors while a floating ground measurement is in progress.

 

 

If you are making measurements in a floating- ground configuration, ensure that the shorting bar is disconnected between the CIRCUIT COMMON and CHASSIS GROUND terminals.

To perform floating-ground measurements

When floating ground measurements are necessary, remove the rear front panel shorting bar connecting the CIRCUIT COMMON and CHASSIS GROUND terminals.

When the shorting bar is removed, you must drive the DUT circuit common with either an SMU, GNDU, or by connecting directly to the DC subsystem circuit common. The circuit common can be found at the DUT ends of the SMU and GNDU cables.

NOTE

The circuit common is not connected through the bias networks.

 

 

 

Read “Precautions for Performing Floating- Ground Measurements" on page 78, then follow these steps to connect the CIRCUIT COMMON to an external ground.

To connect an external ground to the circuit common

Step

1Remove the shorting bar connecting the CIRCUIT COMMON and CHASSIS GROUND terminals.

2Connect the external ground to the CIRCUIT COMMON of the DC subsystem.

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Installation and User’s Guide

Page 78
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Agilent Technologies 85225F manual Precautions for Performing Floating-Ground Measurements

85225F specifications

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