DC Subsystem Functional Verification Test B

Performing the DC Subsystem Functional Verification Test

Complete these steps to run the self- test and verify the operation the DC subsystem.

For Agilent 4156C subsystems:

To perform the Agilent 4156C precision semiconductor parameter analyzer self-test

Step

Notes

1Disconnect all cables from the measurement terminals on the 4156C rear panel.

2Connect the 4156C to line power.

3Switch on the instrument line power switch.

4Wait 1 hour before continuing to step 5.

5 Press System > [CALIB/DIAG].

The analyzer displays the SYSTEM:

 

SELF-CALIBRATION/DIAGNOSTICS

 

screen.

 

 

6 Press [DIAG SELFTST ALL].

This begins the calibration and

 

self-test process.

 

PASS, FAIL, or DONE appear in the

 

STATUS column.

 

If a failure occurs, an error code is

 

displayed in the ERROR column. See

 

“If you encounter a problem.”

 

If no errors occur, DIAG SELF-TEST

 

ALL: PASS appears in the lower

 

left-hand corner of the display.

 

 

If you encounter a problem

Refer to the Agilent 4156C precision semiconductor parameter analyzer manual titled, “If You Have a Problem” for an explanation of the error codes. See the chapter titled, “If Errors Occur When You Perform Self- Calibration or Diagnostics.”

Refer to the troubleshooting information in the service manual for the Agilent 4156C precision semiconductor parameter analyzer.

Installation and User’s Guide

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Agilent Technologies 85225F manual Performing the DC Subsystem Functional Verification Test

85225F specifications

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