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Data Retention and Endurance |
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Parameter |
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DATAR | Data Retention at 55°C |
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NVC | Nonvolatile STORE Operations | 200 |
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Capacitance |
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In the following table, the capacitance parameters are listed.[6] |
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Parameter | Description | Test Conditions | Max |
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CIN | Input Capacitance | TA = 25°C, f = 1 MHz, | 7 |
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COUT | Output Capacitance | 7 |
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Thermal | Resistance |
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In the following table, the thermal resistance parameters are listed.[6] |
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Parameter | Description | Test Conditions |
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ΘJA | Thermal Resistance | Test conditions follow standard test methods and | 33.64 | 32.9 |
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| (Junction to Ambient) | procedures for measuring thermal impedance, per |
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ΘJC | Thermal Resistance | 13.6 | 16.35 |
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| Figure 4. AC Test Loads |
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| R1 577 |
| R1 577 |
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3.0V |
Output |
30 pF |
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789Ω
3.0V |
Output |
5 pF |
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789Ω
AC Test Conditions
Input Pulse Levels | 0V to 3V |
Input Rise and Fall Times (10% to 90%) | <5 ns |
Input and Output Timing Reference Levels | 1.5V |
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: | Page 8 of 18 |
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