CY14B101L

 

 

 

 

 

 

 

 

 

 

Data Retention and Endurance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

Description

Min

 

 

Unit

DATAR

Data Retention at 55°C

 

20

 

Years

NVC

Nonvolatile STORE Operations

200

 

 

 

K

Capacitance

 

 

 

 

 

 

 

In the following table, the capacitance parameters are listed.[6]

 

 

 

 

 

 

Parameter

Description

Test Conditions

Max

 

 

Unit

CIN

Input Capacitance

TA = 25°C, f = 1 MHz,

7

 

 

pF

 

 

VCC = 0 to 3.0V

 

 

 

 

 

COUT

Output Capacitance

7

 

 

pF

Thermal

Resistance

 

 

 

 

 

 

 

In the following table, the thermal resistance parameters are listed.[6]

 

 

 

 

 

 

Parameter

Description

Test Conditions

32-SOIC

48-SSOP

 

Unit

ΘJA

Thermal Resistance

Test conditions follow standard test methods and

33.64

32.9

 

°C/W

 

(Junction to Ambient)

procedures for measuring thermal impedance, per

 

 

 

 

 

 

 

 

EIA / JESD51.

 

 

 

 

ΘJC

Thermal Resistance

13.6

16.35

 

°C/W

 

(Junction to Case)

 

 

 

 

 

 

 

 

 

 

Figure 4. AC Test Loads

 

 

 

 

 

 

 

 

Ω

 

Ω For Tri-state Specs

 

 

R1 577

 

R1 577

 

 

 

 

 

3.0V

Output

30 pF

 

R2

 

 

 

789Ω

3.0V

Output

5 pF

 

R2

 

 

 

789Ω

AC Test Conditions

Input Pulse Levels

0V to 3V

Input Rise and Fall Times (10% to 90%)

<5 ns

Input and Output Timing Reference Levels

1.5V

Note

6. These parameters are guaranteed by design and are not tested.

Document Number: 001-06400 Rev. *I

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Cypress CY14B101L manual Data Retention and Endurance, Capacitance, Thermal Resistance, AC Test Conditions