PRELIMINARY
CY14B101Q1CY14B101Q2CY14B101Q3
Document #: 001-50091 Rev. *A Page 14 of 22

AC Test Conditions

Input Pulse Levels....................................................0V to 3V
Input Rise and Fall Times (10% - 90%)....................... <3 ns
Input and Output Timing Reference Levels.....................1.5V

Data Retention and Endurance

Parameter Description Min Unit
DATARData Retention 20 Years
NVCNonvolatile STORE Operations 200 K

Capacitance

Parameter[6] Description Test Conditions Max Unit
CIN Input Capacitance TA = 25°C, f = 1MHz,
VCC = 3.0V
6pF
COUT Output Pin Capacitance 8 pF

Thermal Resistance

Parameter [6] Description Test Conditions 8-SOIC 8-DFN Unit
ΘJA Thermal Resistance
(Junction to Ambient)
Test conditions follow standard test
methods and procedures for measuring
thermal impedance, per EIA / JESD51.
TBD TBD °C/W
ΘJC Thermal Resistance
(Junction to Case)
TBD TBD °C/W
Figure 20. AC Test Loads and Waveforms
3.0V
OUTPUT
5 pF
R1
R2
789Ω
3.0V
OUTPUT
30 pF
R1
R2
789Ω
577Ω577Ω
Note
6. These parameters are guaranteed by design and are not tested.
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