Cypress CY7C1354C, CY7C1356C manual Pin Definitions

CY7C1354C

CY7C1356C

Pin Definitions

Pin Name

I/O Type

Pin Description

A0, A1

Input-

Address Inputs used to select one of the address locations. Sampled at the rising edge of

A

Synchronous

the CLK.

a,

b,

Input-

Byte Write Select Inputs, active LOW. Qualified with

to conduct writes to the SRAM.

BW

BW

WE

BWc,BWd,

Synchronous

Sampled on the rising edge of CLK. BWa controls DQa and DQPa, BWb controls DQb and DQPb,

BWc controls DQc and DQPc, BWd controls DQd and DQPd.

Input-

Write Enable Input, active LOW. Sampled on the rising edge of CLK if

is active LOW.

WE

CEN

Synchronous

This signal must be asserted LOW to initiate a write sequence.

Input-

Advance/Load Input used to advance the on-chip address counter or load a new address.

ADV/LD

Synchronous

When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, a

new address can be loaded into the device for an access. After being deselected, ADV/LD should

be driven LOW in order to load a new address.

CLK

Input-

Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with

CEN.

Clock

CLK is only recognized if CEN is active LOW.

1

Input-

Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

CE

Synchronous

CE2 and CE3 to select/deselect the device.

CE2

Input-

Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction

Synchronous

with CE1 and CE3 to select/deselect the device.

3

Input-

Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction with

CE

Synchronous

CE1 and CE2 to select/deselect the device.

Input-

Output Enable, active LOW. Combined with the synchronous logic block inside the device to

OE

Asynchronous

control the direction of the I/O pins. When LOW, the I/O pins are allowed to behave as outputs.

When deasserted HIGH, I/O pins are tri-stated, and act as input data pins. OE is masked during

the data portion of a Write sequence, during the first clock when emerging from a deselected

state and when the device has been deselected.

Input-

Clock Enable Input, active LOW. When asserted LOW the clock signal is recognized by the

CEN

Synchronous

SRAM. When deasserted HIGH the clock signal is masked. Since deasserting CEN does not

deselect the device, CEN can be used to extend the previous cycle when required.

DQS

I/O-

Bidirectional Data I/O lines. As inputs, they feed into an on-chip data register that is triggered

Synchronous

by the rising edge of CLK. As outputs, they deliver the data contained in the memory location

specified by addresses during the previous clock rise of the Read cycle. The direction of the pins

is controlled by OE and the internal control logic. When OE is asserted LOW, the pins can behave

as outputs. When HIGH, DQa–DQdare placed in a tri-state condition. The outputs are automat-

ically tri-stated during the data portion of a write sequence, during the first clock when emerging

from a deselected state, and when the device is deselected, regardless of the state of OE.

DQPX

I/O-

Bidirectional Data Parity I/O lines. Functionally, these signals are identical to DQ[a:d]. During

Synchronous

write sequences, DQPa is controlled by BWa, DQPb is controlled by BWb, DQPc is controlled by

BWc, and DQPd is controlled by BWd.

MODE

Input Strap Pin

Mode Input. Selects the burst order of the device. Tied HIGH selects the interleaved burst order.

Pulled LOW selects the linear burst order. MODE should not change states during operation.

When left floating MODE will default HIGH, to an interleaved burst order.

TDO

JTAG serial

Serial data-out to the JTAG circuit. Delivers data on the negative edge of TCK.

output

Synchronous

TDI

JTAG serial input

Serial data-In to the JTAG circuit. Sampled on the rising edge of TCK.

Synchronous

TMS

Test Mode Select

This pin controls the Test Access Port state machine. Sampled on the rising edge of TCK.

Synchronous

TCK

JTAG-Clock

Clock input to the JTAG circuitry.

VDD

Power Supply

Power supply inputs to the core of the device.

VDDQ

I/O Power Supply

Power supply for the I/O circuitry.

VSS

Ground

Ground for the device. Should be connected to ground of the system.

Document #: 38-05538 Rev. *G

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