Figure 18. Word Format
2.4. Test: <Alt-T>
The SUPERPROs can test logic ICs and RAM devices, as well as perform vector testing on PLDs. The
The SUPERPROs provide a 74/54 and 4000/45000 TTL/CMOS logic device test library, and memory test algorithms. Following sections describe the functions available for testing logic ICs and RAMs.Tests are performed by applying the input(s) specified in the test pattern (see below) and checking for the specified output(s). Up to 291 I/O combinations can be specified in a test pattern, allowing quite complex devices to be tested.
2.4.1 New Pattern
To test a new device that is not included in TTL.LIB, a new test pattern may be created. To access this function, click on the Test menu from the main screen, and then click on New Pattern. This selection brings up the Append dialogue box, which consists of IC Type input line, Pin Number input line, and the OK and Cancel buttons. You can input the new IC name and number of pins in the input lines. If the name and the number of pins is not in the current library, pressing OK will open the XXXX edit window (XXXX is the new device name that was entered). Refer to the following when editing a pattern. The following symbols are used throughout the
V:Vcc pin
G:GND (Ground) pin
X:Unused or power pin; output values will not be tested
H:Output Logic High (Voh)
