National Instruments NI PXI-5422

g. Call niFgen_Commit (niFgen Commit VI) to commit the

attribute values to the device using the following parameter:

•vi: The session handle returned from niFgen_InitExtCal

h. Wait 500 ms for the output to settle.

i. Use the DMM to measure the voltage output by the device. This

measurement is measurement 1, which is used in step 12.

j. Call niFgen_WriteBinary16AnalogStaticValue (niFgen

Write Binary 16 Analog Static Value VI) to set the main DAC

value using the following parameters:

•vi: The session handle returned from niFgen_InitExtCal

•channelName: "0"

•value: –32767

k. Call niFgen_SetAttributeViInt32 to set the gain DAC value

(niFgen property node: Calibration»Gain DAC Value) using the

following parameters:

•vi: The session handle returned from niFgen_InitExtCal

•channelName: "0"

•attributeID: NIFGEN_ATTR_GAIN_DAC_VALUE

•value: 1500

l. Call niFgen_Commit (niFgen Commit VI) to commit the

attribute values to the device using the following parameter:

•vi: The session handle returned from niFgen_InitExtCal

m. Wait 500 ms for the output to settle.

n. Use the DMM to measure the voltage output by the device. This

measurement is measurement 2, which is used in step 12.

o. Call niFgen_SetAttributeViInt32 to set the gain DAC value

(niFgen property node: Calibration»Gain DAC Value) using the

following parameters:

•vi: The session handle returned from niFgen_InitExtCal

•channelName: "0"

•attributeID: NIFGEN_ATTR_GAIN_DAC_VALUE

•value: 2300

p. Call niFgen_Commit (niFgen Commit VI) to commit the

attribute values to the device using the following parameter:

•vi: The session handle returned from niFgen_InitExtCal

q. Wait 500 ms for the output to settle.

r. Use the DMM to measure the voltage output by the device. This

measurement is measurement 3, which is used in step 12.