µ
PD75P3116
16 Data Sheet U11369EJ3V0DS

5. DIFFERENCES BETWEEN

µ

PD75P3116 AND

µ

PD753104, 753106, 753108

The
µ
PD75P3116 replaces the internal mask ROM in the
µ
PD753104, 753106, and 753108 with a one-time PROM
and features expanded ROM capacity. The
µ
PD75P3116’s Mk I mode supports the Mk I mode in the
µ
PD753104, 753106,
and 753108 and the
µ
PD75P3116’s Mk II mode supports the Mk II mode in the
µ
PD753104, 753106, and 753108.
Table 5-1 lists differences between the
µ
PD75P3116 and the
µ
PD753104, 753106, and 753108. Be sure to check the
differences between these products before using them with PROMs for debugging or prototype testing of application
systems or, later, when using them with a mask ROM for full-scale production.
For details of the CPU functions and internal hardware, refer to the User’s Manual.
Table 5-1. Differences Between
µ
PD75P3116 and
µ
PD753104, 753106, and 753108
Item
µ
PD753104
µ
PD753106
µ
PD753108
µ
PD75P3116
Program counter 12 bits 13 bits 14 bits
Program memory (bytes) Mask ROM Mask ROM Mask ROM One-time PROM
4096 6144 8192 16384
Data memory (× 4 bits) 512
Mask options Pull-up resistor for Available Not available
Port 5 (On chip/not on chip can be specified.) (Not on chip)
Split resistor for
LCD driving power supply
Wait time after Available Not available
RESET (Selectable between 217/fX and 215/fX)Note (Fixed to 215/fX)Note
Feedback resistor Available Not available
of subsystem clock (Use/not use can be selected.) (Enable)
Pin configuration Pins 5 to 8 P30 to P33
P30/MD0 to P33/MD3
Pins 10 to 13 P50 to P53 P50/D4 to P53/D7
Pins 14 to 17 P60/KR0 to P63/KR3
P60/KR0/D0 to P63/KR3/D3
Pin 21 IC VPP
Other Noise resistance and noise radiation may differ due to the different circuit sizes and mask
layouts.
Note 217/fX: 21.8 ms at 6.0 MHz operation, 31.3 ms at 4.19 MHz operation
215/fX: 5.46 ms at 6.0 MHz operation, 7.81 ms at 4.19 MHz operation
Caution There are differences in the amount of noise tolerance and noise radiation between flash memory
versions and mask ROM versions. When considering changing from a flash memory version to a mask
ROM version during the process from experimental manufacturing to mass production, make sure to
sufficiently evaluate commercial samples (CS) (not engineering samples (ES)) of the mask ROM
versions.