PMC |
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| Pm25LV512/010 | |
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PROGRAM/ERASE PERFORMANCE |
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Parameter | Unit | Typ | Max | Remarks | |
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Sector Erase Time | ms | 40 | 100 | From writing erase command to erase completion | |
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Block Erase Time | ms | 40 | 100 | From writing erase command to erase completion | |
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Chip Erase Time | ms | 40 | 100 | From writing erase command to erase completion | |
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Page Programming Time | ms | 2 | 5 | From writing program command to program | |
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Note: These parameters are characterized and are not 100% tested.
RELIABILITY CHARACTERISTICS (1)
Parameter | Min | Typ | Unit | Test Method |
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Endurance | 100,000 (2) |
| Cycles | JEDEC Standard A117 |
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Data Retention | 20 |
| Years | JEDEC Standard A103 |
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ESD - Human Body Model | 2,000 |
| Volts | JEDEC Standard A114 |
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ESD - Machine Model | 200 |
| Volts | JEDEC Standard A115 |
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100 + ICC1 |
| mA | JEDEC Standard 78 | |
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Note: 1. These parameters are characterized and are not 100% tested.
2. Preliminary specification only and will be formalized after cycling qualification test.
Programmable Microelectronics Corp. | 21 | Issue Date: February, 2004, Rev: 1.4 |
