S3C8275X/F8275X/C8278X/F8278X/C8274X/F8274X ELECTRICAL DATA
17-11
Table 17-10. Main Oscillation Stabilization Time
(TA = − 25 °C to + 85
°C, VDD = 2.0 V to 3.6 V)
Oscillator Test Condition Min Typ Max Unit
Crystal fx > 1 MHz − − 40 ms
Ceramic Oscillation stabilization occurs when VDD is
equal to the minimum oscillator voltage
range.
− − 10 ms
External clock XIN input high and low width (tXH, tXL) 62.5 − 1250 ns
t
X
t
XL
V
DD
-0.1 V
0.1 V
X
IN
1/fx
Figure 17-7. Clock Timing Measurement at XIN