ELECTRICAL DATA S3C8275X/F8275X/C8278X/F8278X/C8274X/F8274X
17-12
Table 17-11. Sub Oscillation Stabilization Time
(TA = − 25 °C to + 85
°C, VDD = 2.0 V to 3.6 V)
Oscillator Test Condition Min Typ Max Unit
Crystal –
− − 10 s
External clock XTIN input high and low width (tXH, tXL) 5 − 15 µs
t
XTH
t
XTL
V
DD
-0.1 V
0.1 V
XT
IN
1/fxt
Figure 17-8. Clock Timing Measurement at XTIN