uPSD3212A, uPSD3212C, uPSD3212CV
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MAXIMUM RATINGStressing the device above the rating listed in the
Absolute Maximum Ratings” table may cause per-
manent damage to the device. These are stress
ratings only and operation of the device at these or
any other conditions above those indicated in the
Operating sections of this specification is not im-
plied. Exposure to Absolute Maximum Rating con-
ditions for extended periods may affect device
reliability. Refer also to the STMicroelectronics
SURE Program and other relevant quality docu-
ments.
Table 105. Absolute Maximum Ratings
Note: 1. IPC/JEDEC J-STD-020A
2. JEDEC Std JESD22-A114A (C1=100pF, R1=1500 Ω, R2=500 Ω)
Symbol Parameter Min. Max. Unit
TSTG Storage Temperature –65 125 °C
TLEAD Lead Temperature during Soldering (20 seconds max.)(1) 235 °C
VIO Input and Output Voltage (Q = VOH or Hi-Z) –0.5 6.5 V
VCC Supply Voltage –0.5 6.5 V
VPP Device Programmer Supply Voltage –0.5 14.0 V
VESD Electrostatic Discharge Voltage (Human Body Model) (2) –2000 2000 V