Comprehensive error log

Byte

First sector

Subsequent sectors

0

SMART error log version

Reserved

1

Error log index

Reserved

2-91

First error log data structure

Data structure 5n+1

92-181

Second error log data structure

Data structure 5n+2

182-271

Third error log data structure

Data structure 5n+3

272-361

Fourth error log data structure

Data structure 5n+4

362-451

Fifth error log data structure

Data structure 5n+5

452-453

Device error count

Reserved

454-510

Reserved

Reserved

511

Data structure checksum

Data structure checksum

n is the sector number within the log. The first sector is sector zero

11.8.42.6.3.1 Error log version

The value of the error log version byte shall be set to 01h.

11.8.42.6.3.2 Error log index

The error log index indicates the error log data structure representing the most recent error. If there have been no error log entries, the error log index is set to zero. Valid values for the error log index are zero to 255.

11.8.42.6.3.3 Error log data structure

The error log is viewed as a circular buffer. The device may support from two to 51 error log sectors. When the last supported error log sector has been filled, the next error shall create an error log data structure that replaces the first error log data structure in sector zero. The next error after that shall create an error log data structure that replaces the second error log data structure in sector zero. The sixth error after the log has filled shall replace the first error log data structure in sector one, and so on.

The error log index indicates the most recent error log data structure. Unused error log data structures shall be filled with zeros.

The content of the error log data structure entries is defined in 11.8.42.6.2.2.

11.8.42.6.3.4 Device error count

The device error count field is defined in 11.8.42.6.2.5.

11.8.42.6.3.5 Data structure checksum

The data structure checksum is defined in 11.8.42.6.2.6.

11.8.42.6.4 Self-test log sector

The following Table defines the 512 bytes that make up the SMART self-test log sector.

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