Toshiba MK1032GAX Byte, Read/write, Description, Selective self-testlog, 11.8.42.6.4.3 Self-testindex, 11.8.42.6.5 Selective self-testlog, 11.8.42.6.5.2 Test span definition

11.8.42.6.4.3 Self-test index

The self-test index will point to the most recent entry. Initially, when the log is empty, the index will be set to zero. It will be set to one when the first entry is made, two for the second entry, etc., until the 22nd entry, when the index will be reset to one.

11.8.42.6.4.4 Data structure checksum

The data structure checksum is the two's complement of the sum of the first 511 bytes in the data structure. Each byte will be added with unsigned arithmetic, and overflow will be ignored. The sum of all 512 bytes is zero when the checksum is correct. The checksum is placed in byte 511.

11.8.42.6.5 Selective self-test log

The Selective self-test log is a log that may be both written and read by the host. This log allows the host to select the parameters for the self-test and to monitor the progress of the self-test. The following table defines the content of the Selective self-test log.

Selective self-test log

Byte	Description	Read/write
0-1	Data structure revision number	R/W
2-9	Starting LBA for test span 1	R/W
10-17	Ending LBA for test span 1	R/W
18-25	Starting LBA for test span 2	R/W
26-33	Ending LBA for test span 2	R/W
34-41	Starting LBA for test span 3	R/W
42-49	Ending LBA for test span 3	R/W
50-57	Starting LBA for test span 4	R/W
58-65	Ending LBA for test span 4	R/W
66-73	Starting LBA for test span 5	R/W
74-81	Ending LBA for test span 5	R/W
82-337	Reserved	Reserved
338-491	Vendor specific	Vendor specific
492-499	Current LBA under test	Read
500-501	Current span under test	Read
502-503	Feature flags	R/W
504-507	Vendor specific	Vendor specific
508-509	Selective self-test pending time	R/W
510	Reserved	Reserved
511	Data structure checksum	R/W

11.8.42.6.5.1 Data structure revision number

The value of the data structure revision number filed shall be 01h. This value shall be written by the host and returned unmodified by the device.

11.8.42.6.5.2 Test span definition

The Selective self-test log provides for the definition of up to five test spans. The starting LBA for each test span is the LBA of the first sector tested in the test span and the ending LBA for each test span is the last LBA tested in the test span. If the starting and ending LBA values for a test span are both zero, a test span is not defined and not tested. These values shall be written by the host and returned unmodified by the device.

11.8.42.6.5.3 Current LBA under test

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