Cypress CY7C1346H manual Switching Characteristics Over the Operating Range 11

CY7C1346H

Switching Characteristics Over the Operating Range[11, 12]

-166

Parameter

Description

Unit

Min.

Max.

tPOWER

VDD(Typical) to the First Access[13]

1

ms

Clock

tCYC

Clock Cycle Time

6.0

ns

tCH

Clock HIGH

2.5

ns

tCL

Clock LOW

2.5

ns

Output Times

tCO

Data Output Valid after CLK Rise

3.5

ns

tDOH

Data Output Hold after CLK Rise

1.5

ns

tCLZ

Clock to Low-Z[14, 15, 16]

0

ns

tCHZ

Clock to High-Z[14, 15, 16]

3.5

ns

tOEV

LOW to Output Valid

3.5

ns

OE

t

LOW to Output Low-Z[14, 15, 16]

0

ns

OE

OELZ

tOEHZ

HIGH to Output High-Z[14, 15, 16]

3.5

ns

OE

Set-up Times

tAS

Address Set-up before CLK Rise

1.5

ns

tADS

Set-up before CLK Rise

1.5

ns

ADSC,

ADSP

tADVS

Set-up before CLK Rise

1.5

ns

ADV

tWES

[A:D] Set-up before CLK Rise

1.5

ns

GW,

BWE,

BW

tDS

Data Input Set-up before CLK Rise

1.5

ns

tCES

Chip Enable Set-Up before CLK Rise

1.5

ns

Hold Times

tAH

Address Hold after CLK Rise

0.5

ns

tADH

Hold after CLK Rise

0.5

ns

ADSP,

ADSC

tADVH

Hold after CLK Rise

0.5

ns

ADV

tWEH

[A:D] Hold after CLK Rise

0.5

ns

GW,

BWE,

BW

tDH

Data Input Hold after CLK Rise

0.5

ns

tCEH

Chip Enable Hold after CLK Rise

0.5

ns

Notes:

11.Timing reference level is 1.5V when VDDQ = 3.3V and 1.25V when VDDQ = 2.5V.

12.Test conditions shown in (a) of AC Test Loads unless otherwise noted.

13.This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially before a Read or Write operation can be initiated.

14.tCHZ, tCLZ, tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.

15.At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed to achieve High-Z prior to Low-Z under the same system conditions.

16.This parameter is sampled and not 100% tested.

Document #: 38-05672 Rev. *B Page 10 of 16

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