Agilent Technologies ES, 8720ET, 8722ET, 8719ET quick start Index

Index

Numerics

3 dB bandwidth measuring, 2-10

6 dB bandwidth measuring, 2-11

A

active channel keys location, 2-4

admittance measuring, 2-22

Agilent Technologies Sales and

Service Offices, 2-26analyzer configuration, 1-9–1-19

attaching cabinet flanges with front handles, 1-19

attaching cabinet flanges without front handles, 1-18

attaching front handles, 1-17for bench top use, 1-16

for rack mount use, 1-16option 1D5, 1-10standard, 1-10

with printers or plotters, 1-11

B

backing up EEPROM disk, 1-26bench top configuration, 1-16

C

connectors

R channel, 2-4

D

definitions magnitude of reflection

coefficient, 2-13reflection coefficient, 2-13return loss (dB), 2-13standing-wave-ratio (SWR),

2-13

disk drive location, 2-3disk eject button, 2-3display location, 2-3

E

EEPROM backup disk, 1-26electrical and environmental

requirements, 1-7entry block location, 2-4

F

front panel, 1-5,2-3

H

high stability frequency reference configuration, 1-10

I

impedance measuring, 2-21

insertion loss measuring, 2-8

installation, 1-2

instrument state function block keys, 2-4

L

line switch, 2-3location

active channel keys, 2-4disk drive, 2-3

disk eject button, 2-3display, 2-3

entry block, 2-4

instrument state function block keys, 2-4

line switch, 2-3PORT 1, 2-4PORT 2, 2-4Preset key, 2-4

R channel connectors, 2-4REFLECTION port, 2-4response function block keys,

2-3Return key, 2-3softkeys, 2-3

stimulus function block keys, 2-3

TRANSMISSION port, 2-4

M

making measurements, 2-1–2-22measurement procedure, 2-5

choosing measurement parameters, 2-5measuring a device, 2-5outputting measurement

results, 2-5performing a measurement

calibration, 2-5measuring insertion loss with

marker functions, 2-10

O

operation, 1-20–1-25installed options, 1-21operator’s check, 1-23self-test,1-22

testing reflection mode, 1-25testing transmission mode, 1-24

operator’s check, 1-23out-of-band rejection measuring, 2-11

P

parts list

parts received, 1-4passband flatness

measuring, 2-12passband ripple

measuring, 2-12plotter configuration, 1-11polar format

measuring, 2-20PORT 1

location, 2-4PORT 2

location, 2-4Preset key

location, 2-4

printer configuration, 1-11problems, data entry, 2-24

controls do not respond, 2-24parameters not accepted, 2-24

problems, power-up,2-23–2-24display does not light, 2-23display lights but fan does not

start, 2-24problems, RF output, 2-24

no RF signal at front panel port, 2-24

R

R channel connectors location, 2-4

rack mount configuration, 1-16rear panel, 1-6

reflection measurements, 2-13–2-22

admittance, 2-22choosing measurement

parameters, 2-14impedance, 2-21

measuring in polar format, 2-20measuring in smith chart

format, 2-21

measuring reflection coefficient, 2-18

measuring return loss, 2-16measuring standing wave ratio

(SWR), 2-19measuring the device, 2-16outputting measurement

results, 2-17

Index 1