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| CY7C1330AV25 | |
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| PRELIMINARY | CY7C1332AV25 | ||
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| Pin Definitions |
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| Name | I/O Type | Description |
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| A | Input- | Address Inputs used to select one of the address locations. Sampled at the rising | |||||||||||
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| Synchronous | edge of the K. |
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| a | Input- | Byte Write Select Inputs, active LOW. Qualified with |
| to conduct writes to the | |||
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| BWS | WE | ||||||||||||
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| BWSb | Synchronous | SRAM. Sampled on the rising edge of CLK. BWSa controls DQa, BWSb controls DQb, | |||||||||||
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| BWSc |
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| BWSc controls DQc, BWSd controls DQd. |
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| BWSd |
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| Input- | Write Enable Input, active LOW. Sampled on the rising edge of CLK. This signal must | ||||||
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| WE | |||||||||||||
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| Synchronous | be asserted LOW to initiate a write sequence and high to initiate a read sequence. | |||||
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| Input- | Clock Inputs. Used to capture all synchronous inputs to the device. | |||||
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| K,K |
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| Differential Clock |
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| Input- | Chip Enable Input, active LOW. Sampled on the rising edge of CLK. Used to | ||||||||
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| CE | |||||||||||||
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| Synchronous | select/deselect the device. |
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| Input- | Output Enable, active LOW. Combined with the synchronous logic block inside the | ||||||||
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| OE | |||||||||||||
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| Asynchronous | device to control the direction of the I/O pins. When LOW, the I/O pins are allowed to | |||||
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| behave as outputs. When deasserted HIGH, I/O pins are | |||
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| data pins. OE is masked during the data portion of a write sequence, during the first | |||
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| clock when emerging from a deselected state and when the device has been | |||
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| deselected. |
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| DQa | I/O- | Bidirectional Data I/O lines. As inputs, they feed into an | |||||||||||
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| DQb | Synchronous | triggered by the rising edge of CLK. As outputs, they deliver the data contained in the | |||||||||||
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| DQc |
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| memory location specified by A[x:0] during the previous clock rise of the read cycle. The | |||||||||
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| DQd |
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| direction of the pins is controlled by OE and the internal control logic. When OE is | |||||||||
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| asserted LOW, the pins can behave as outputs. When HIGH, | |||
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| a | |||
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| a write sequence, during the first clock when emerging from a deselected state, and | |||
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| when the device is deselected, regardless of the state of OE. DQ a,b,c,d are 9 bits wide | |||
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| M1, M2 | Read Protocol Mode | Mode control pins, used to set the proper read protocol. For specified device | |||||||||||
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| Pins | operation, M1 must be connected to VSS, and M2 must be connected to VDD or VDDQ. | |||||
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| These mode pins must be set at | |||
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| operation. |
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| ZZ | Input- | ZZ “sleep” Input. This active HIGH input places the device in a | |||||||||||
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| Asynchronous | condition with data integrity preserved. |
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| ZQ | Input | Output Impedance Matching Input. This input is used to tune the device outputs to | |||||||||||
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| the system data bus impedance. Q[x:0] output impedance are set to 0.2 x RQ, where | |||
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| RQ is a resistor connected between ZQ and ground. Alternately, this pin can be | |||
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| connected directly to VDDQ, which enables the minimum impedance mode. This pin | |||
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| cannot be connected directly to GND or left unconnected. |
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| VDD | Power Supply | Power supply inputs to the core of the device. For this device, the VDD is 2.5V. | |||||||||||
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| VDDQ | I/O Power Supply | Power supply for the I/O circuitry. For this device, the VDDQ is 1.5V. | |||||||||||
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| VREF | Input- | Reference Voltage Input. Static input used to set the reference level for HSTL inputs | |||||||||||
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| Reference Voltage | and Outputs as well as AC measurement points. |
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| VSS | Ground | Ground for the device. Should be connected to ground of the system. | |||||||||||
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| TDO | JTAG serial output | Serial | |||||||||||
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| Synchronous |
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| TDI | JTAG serial input | Serial | |||||||||||
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| Synchronous |
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| TMS | Test Mode Select | This pin controls the Test Access Port state machine. Sampled on the rising edge | |||||||||||
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| Synchronous | of TCK. |
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| TCK | JTAG serial clock | Serial clock to the JTAG circuit. |
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| NC | – | No connects. |
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Document No: |
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| Page 3 of 19 |
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