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| CY7C1355C | |||
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| CY7C1357C | |||
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| Pin Definitions |
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| Name | I/O |
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| Description | ||||||||||
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| A0, A1, A | Input- | Address Inputs used to select one of the address locations. Sampled at the rising edge | ||||||||||||||||||
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| Synchronous | of the CLK. A[1:0] are fed to the | |||||||||
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| A, |
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| B | Input- | Byte Write Inputs, active LOW. Qualified with |
| to conduct Writes to the SRAM. Sampled | ||||||||||
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| BW | BW | WE | ||||||||||||||||||
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| BWC, BWD | Synchronous | on the rising edge of CLK. | ||||||||||||||||||
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| Input- | Write Enable Input, active LOW. Sampled on the rising edge of CLK if |
| is active LOW. | |||||||||
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| WE | CEN | |||||||||||||||||||
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| Synchronous | This signal must be asserted LOW to initiate a write sequence. | |||||||||
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| Input- | Advance/Load Input. Used to advance the | ||||||||||
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| ADV/LD | ||||||||||||||||||||
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| Synchronous | When HIGH (and CEN is asserted LOW) the internal burst counter is advanced. When LOW, | |||||||||
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| a new address can be loaded into the device for an access. After being deselected, ADV/LD | |||||||
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| should be driven LOW in order to load a new address. | |||||||
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| CLK | Input- | Clock Input. Used to capture all synchronous inputs to the device. CLK is qualified with | ||||||||||||||||||
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| Clock | CEN. CLK is only recognized if CEN is active LOW. | |||||||||
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| 1 |
| Input- | Chip Enable 1 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction | ||||||||||||||||
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| CE | ||||||||||||||||||||
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| Synchronous | with CE2, and CE3 to select/deselect the device. | |||||||||
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| CE2 | Input- | Chip Enable 2 Input, active HIGH. Sampled on the rising edge of CLK. Used in conjunction | ||||||||||||||||||
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| Synchronous | with CE1 and CE3 to select/deselect the device. | |||||||||
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| 3 |
| Input- | Chip Enable 3 Input, active LOW. Sampled on the rising edge of CLK. Used in conjunction | ||||||||||||||||
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| CE | ||||||||||||||||||||
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| Synchronous | with CE1 and CE2 to select/deselect the device. | |||||||||
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| Input- | Output Enable, asynchronous input, active LOW. Combined with the synchronous logic | |||||||||||||||
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| OE | ||||||||||||||||||||
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| Asynchronous | block inside the device to control the direction of the I/O pins. When LOW, the I/O pins are | |||||||||
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| allowed to behave as outputs. When deasserted HIGH, I/O pins are | |||||||
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| input data pins. OE is masked during the data portion of a write sequence, during the first | |||||||
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| clock when emerging from a deselected state, when the device has been deselected. | |||||||
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| Input- | Clock Enable Input, active LOW. When asserted LOW the Clock signal is recognized by | |||||||||||||
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| CEN | ||||||||||||||||||||
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| Synchronous | the SRAM. When deasserted HIGH the Clock signal is masked. Since deasserting CEN | |||||||||
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| does not deselect the device, CEN can be used to extend the previous cycle when required. | |||||||
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| ZZ | Input- | ZZ “Sleep” Input. This active HIGH input places the device in a | ||||||||||||||||||
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| Asynchronous | condition with data integrity preserved. For normal operation, this pin has to be LOW or left | |||||||||
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| floating. ZZ pin has an internal | |||||||
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| DQs | I/O- | Bidirectional Data I/O lines. As inputs, they feed into an | ||||||||||||||||||
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| Synchronous | triggered by the rising edge of CLK. As outputs, they deliver the data contained in the | |||||||||
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| memory location specified by the addresses presented during the previous clock rise of the | |||||||
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| Read cycle. The direction of the pins is controlled by OE. When OE is asserted LOW, the | |||||||
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| pins behave as outputs. When HIGH, DQs and DQPX are placed in a | |||||||
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| outputs are automatically | |||||||
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| first clock when emerging from a deselected state, and when the device is deselected, | |||||||
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| regardless of the state of OE. | |||||||
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| DQPX | I/O- | Bidirectional Data Parity I/O Lines. Functionally, these signals are identical to DQs. During | ||||||||||||||||||
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| Synchronous | Write sequences, DQPX is controlled by BWX correspondingly. | |||||||||
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| MODE | Input Strap Pin | Mode Input. Selects the burst order of the device. When tied to Gnd selects linear burst | ||||||||||||||||||
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| sequence. When tied to VDD or left floating selects interleaved burst sequence. | |||||||
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| VDD | Power Supply | Power supply inputs to the core of the device. | ||||||||||||||||||
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| VDDQ | I/O Power | Power supply for the I/O circuitry. | ||||||||||||||||||
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| Supply |
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| VSS | Ground | Ground for the device. | ||||||||||||||||||
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| TDO | JTAG serial output | Serial | ||||||||||||||||||
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| Synchronous | feature is not being utilized, this pin should be left unconnected. This pin is not available on | |||||||||
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| TQFP packages. | |||||||
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| TDI | JTAG serial input | Serial | ||||||||||||||||||
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| Synchronous | is not being utilized, this pin can be left floating or connected to VDD through a pull up resistor. | |||||||||
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| This pin is not available on TQFP packages. | |||||||
Document #: |
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| Page 7 of 28 |
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