CY7C1355C
CY7C1357C
Document #: 38-05539 Rev. *E Page 20 of 28
Switching Characteristics Over the Operating Range[16, 17]
Parameter Description
–133 –100
UnitMin. Max. Min. Max.
tPOWER VDD(Typical) to the First Access[18] 11ms
Clock
tCYC Clock Cycle Time 7.5 10 ns
tCH Clock HIGH 3.0 4.0 ns
tCL Clock LOW 3.0 4.0 ns
Output Times
tCDV Data Output Valid after CLK Rise 6.5 7.5 ns
tDOH Data Output Hold after CLK Rise 2.0 2.0 ns
tCLZ Clock to Low-Z[19, 20, 21] 00ns
tCHZ Clock to High-Z[19, 20, 21] 3.5 3.5 ns
tOEV OE LOW to Output Valid 3.5 3.5 ns
tOELZ OE LOW to Output Low-Z[19, 20, 21] 00ns
tOEHZ OE HIGH to Output High-Z[19, 20, 21] 3.5 3.5 ns
Set-up Times
tAS Address Set-up before CLK Rise 1.5 1.5 ns
tALS ADV/LD Set-up before CLK Rise 1.5 1.5 ns
tWES WE, BWX Set-up before CLK Rise 1.5 1.5 ns
tCENS CEN Set-up before CLK Rise 1.5 1.5 ns
tDS Data Input Set-up before CLK Rise 1.5 1.5 ns
tCES Chip Enable Set-Up before CLK Rise 1.5 1.5 ns
Hold Times
tAH Address Hold after CLK Rise 0.5 0.5 ns
tALH ADV/LD Hold after CLK Rise 0.5 0.5 ns
tWEH WE, BWX Hold after CLK Rise 0.5 0.5 ns
tCENH CEN Hold after CLK Rise 0.5 0.5 ns
tDH Data Input Hold after CLK Rise 0.5 0.5 ns
tCEH Chip Enable Hold after CLK Rise 0.5 0.5 ns
Notes:
16.Timing reference level is 1.5V when VDDQ = 3.3V and is 1.25V when VDDQ = 2.5V.
17.Test conditions shown in (a) of AC Test Loads unless otherwise noted.
18.This part has a voltage regulator internally; tPOWER is the time that the power needs to be supplied above VDD(minimum) initially, before a Read or Write operation
can be initiated.
19.tCHZ, tCLZ,tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of AC Test Loads. Transition is measured ± 200 mV from steady-state voltage.
20.At any given voltage and temperature, tOEHZ is less than tOELZ and tCHZ is less than tCLZ to eliminate bus contention between SRAMs when sharing the same
data bus. These specifications do not imply a bus contention condition, but reflect parameters guaranteed over worst case user conditions. Device is designed
to achieve High-Z prior to Low-Z under the same system conditions.
21.This parameter is sampled and not 100% tested.
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