Table 5.8 Features Register values (subcommands) and functions

Features Resister

Function

 

 

X’D0’

SMART Read Attribute Values:

 

A device that received this subcommand asserts the BSY bit and saves all the

 

updated attribute values. The device then clears the BSY bit and transfers 512-

 

byte attribute value information to the host.

 

* For information about the format of the attribute value information, see Table 5.9.

X’D1’

SMART Read Attribute Thresholds:

 

This subcommand is used to transfer 512-byte insurance failure threshold value

 

data to the host.

 

* For information about the format of the insurance failure threshold value data,

 

see Table 5.10.

X’D2’

SMART Enable-Disable Attribute AutoSave:

 

This subcommand is used to enable (SC register !!XX!! 00h) or disable (SC

 

register = 00h) the setting of the automatic saving feature for the device attribute

 

data. The setting is maintained every time the device is turned off and then on.

 

When the automatic saving feature is enabled, the attribute values are saved after

 

15 minutes passed since the previous saving of the attribute values. However, if

 

the failure prediction feature is disabled, the attribute values are not automatically

 

saved.

 

When the device receives this subcommand, it asserts the BSY bit, enables or

 

disables the automatic saving feature, then clears the BSY bit.

X’D3’

SMART Save Attribute Values:

 

When the device receives this subcommand, it asserts the BSY bit, saves device

 

attribute value data, then clears the BSY bit.

X’D8’

SMART Enable Operations:

 

This subcommand enables the failure prediction feature. The setting is

 

maintained even when the device is turned off and then on.

 

When the device receives this subcommand, it asserts the BSY bit, enables the

 

failure prediction feature, then clears the BSY bit.

X’D9’

SMART Disable Operations:

 

This subcommand disables the failure prediction feature. The setting is

 

maintained even when the device is turned off and then on.

 

When the device receives this subcommand, it asserts the BSY bit, disables the

 

failure prediction feature, then clears the BSY bit.

X’DA’

SMART Return Status:

 

When the device receives this subcommand, it asserts the BSY bit and saves the

 

current device attribute values. Then the device compares the device attribute

 

values with insurance failure threshold values. If there is an attribute value

 

exceeding the threshold, F4h and 2Ch are loaded into the CL and CH registers. If

 

there are no attribute values exceeding the thresholds, 4Fh and C2h are loaded

 

into the CL and CH registers. After the settings for the CL and CH registers have

 

been determined, the device clears the BSY bit

The host must regularly issue the SMART Read Attribute Values subcommand (FR register = D0h), SMART Save Attribute Values subcommand (FR register = D3h), or SMART Return Status subcommand (FR register = DAh) to save the device attribute value data on a medium.

C141-E077-01EN

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Fujitsu MPE3XXXAT manual Features Register values subcommands and functions, ’Da’
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