Xilinx UG078 manual DUT Socket, Pin Breakout, Area, Detailed Description, SF363, FF668, Label

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Detailed Description

12. DUT Socket

The DUT socket contains the user FPGA, referred to as the device under test (DUT). The DUT must be oriented using the P1 indicator on the board.

Caution! Failure to insert the device to the proper orientation can damage the device. To avoid pin damage, always use the vacuum tool provided when inserting or removing the Virtex-4 device. When using BGA packages, do not apply pressure to the device while activating the socket. Doing so can damage the socket and/or the device.

13. Pin Breakout

The pin breakout area is used to monitor or apply signals to each of the DUT pins. Headers can be soldered to the breakout area to use with certain types of oscilloscope probes, for either connecting function generators or wiring pins to the pin breakout area. Clocks in the pin breakout area that connect to the DUT clock pads are shown in Table 8 and Table 9, page 20.

Table 8: Breakout Clock Pin Connections for SF363 and FF668

	SF363		FF668
Label	Clock Name	Pin	Clock Name	Pin
		Number		Number
	IO_L4P_GC_LC_3	B10	IO_L4P_GC_LC_3	B13
	IO_L4N_GC_VREF_LC_3	C10	IO_L4N_GC_VREF_LC_3	B12
	IO_L5P_GC_LC_3	B13	IO_L5P_GC_LC_3	A16
	IO_L5N_GC_LC_3	A13	IO_L5N_GC_LC_3	A15
	IO_L6P_GC_LC_3	A8	IO_L6P_GC_LC_3	A10
	IO_L6N_GC_LC_3	B8	IO_L6N_GC_LC_3	B10
	IO_L7P_GC_LC_3	B14	IO_L7P_GC_LC_3	B17
Area	IO_L7N_GC_LC_3	A14	IO_L7N_GC_LC_3	A17
	IO_L3P_GC_LC_3	C11	IO_L3P_GC_LC_3	C14
Breakout	IO_L3N_GC_LC_3	B11	IO_L3N_GC_LC_3	C15
	IO_L4P_GC_LC_4	Y6	IO_L4P_GC_LC_4	AF11
	IO_L4N_GC_VREF_LC_4	W6	IO_L4N_GC_VREF_LC_4	AF10
	IO_L5P_GC_LC_4	W11	IO_L5P_GC_LC_4	AE14
	IO_L5N_GC_LC_4	W10	IO_L5N_GC_LC_4	AE13
	IO_L6P_GC_LC_4	Y7	IO_L6P_GC_LC_4	AE10
	IO_L6N_GC_LC_4	W7	IO_L6N_GC_LC_4	AD10
	IO_L7P_GC_VRN_LC_4	Y10	IO_L7P_GC_VRN_LC_4	AD17
	IO_L7N_GC_VRP_LC_4	Y9	IO_L7N_GC_VRP_LC_4	AD16
	IO_L3P_GC_CC_LC_4	Y12	IO_L3P_GC_CC_LC_4	AB17
	IO_L3N_GC_CC_LC_4	Y11	IO_L3N_GC_CC_LC_4	AC17

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UG078 (v1.2) May 24, 2006