Cypress CY7C1303BV25, CY7C1306BV25 manual Introduction

Page 5

 

 

 

 

 

CY7C1303BV25

 

 

 

 

 

CY7C1306BV25

 

 

 

 

 

 

 

Pin Definitions (continued)

 

 

 

 

Name

 

I/O

Description

 

 

 

 

NC/36M

 

N/A

Address expansion for 36M. This pin is not connected to the die and so can be tied to any

 

 

 

 

 

voltage level on CY7C1303BV25/CY7C1306BV25.

GND/72M

 

Input

Address expansion for 72M. This pin has to be tied to GND on CY7C1303BV25.

 

 

 

 

NC/72M

 

N/A

Address expansion for 72M. This pin can be tied to any voltage level on CY7C1306BV25.

 

 

 

 

GND/144M

 

Input

Address expansion for 144M. This pin has to be tied to GND on

 

 

 

 

 

CY7C1303BV25/CY7C1306BV25.

GND/288M

 

Input

Address expansion for 288M. This pin has to be tied to GND on CY7C1306BV25.

 

 

 

 

NC

 

N/A

Not connected to the die. Can be tied to any voltage level.

 

 

 

 

VREF

 

Input-

Reference Voltage Input. Static input used to set the reference level for HSTL inputs and Outputs

 

 

Reference

as well as AC measurement points.

VDD

 

Power Supply

Power supply inputs to the core of the device.

VSS

 

Ground

Ground for the device.

VDDQ

 

Power Supply

Power supply inputs for the outputs of the device.

Introduction

Functional Overview

The CY7C1303BV25/CY7C1306BV25 are synchronous pipelined Burst SRAM equipped with both a Read port and a Write port. The Read port is dedicated to Read operations and the Write port is dedicated to Write operations. Data flows into the SRAM through the Write port and out through the Read port. These devices multiplex the address inputs in order to minimize the number of address pins required. By having separate Read and Write ports, this architecture completely eliminates the need to “turn-around” the data bus and avoids any possible data contention, thereby simplifying system design. 38-05627Each access consists of two 18-bit data transfers in the case of CY7C1303BV25, and two 36-bit data transfers in the case of CY7C1306BV25, in one clock cycle.

Accesses for both ports are initiated on the rising edge of the Positive Input Clock (K). All synchronous input timing is refer- enced from the rising edge of the input clocks (K and K) and all output timings are referenced to rising edge of output clocks (C and C or K and K when in single clock mode).

All synchronous data inputs (D[x:0]) pass through input registers controlled by the rising edge of the input clocks (K and K). All synchronous data outputs (Q[x:0]) pass through output registers controlled by the rising edge of the output clocks (C and C, or K and K when in single clock mode).

All synchronous control (RPS, WPS, BWS[x:0]) inputs pass through input registers controlled by the rising edge of input clocks (K and K).

The following descriptions take CY7C1303BV25 as an example. The same basic descriptions apply to CY7C1306BV25.

Read Operations

The CY7C1303BV25 is organized internally as 2 arrays of 512K x 18. Accesses are completed in a burst of two sequential 18-bit data words. Read operations are initiated by asserting RPS active at the rising edge of the positive input clock (K). The address is latched on the rising edge of the K clock. Following the next K clock rise the corresponding lower order 18-bit word of data is driven onto the Q[17:0] using C as

Document #: 38-05627 Rev. *A

the output timing reference. On the subsequent rising edge of C the higher order data word is driven onto the Q[17:0]. The requested data will be valid 2.5 ns from the rising edge of the output clock (C and C, or K and K when in single clock mode, 250-MHz device).

Synchronous internal circuitry will automatically three-state the outputs following the next rising edge of the positive output clock (C). This will allow for a seamless transition between devices without the insertion of wait states in a depth expanded memory.

Write Operations

Write operations are initiated by asserting WPS active at the rising edge of the positive input clock (K). On the same K clock rise the data presented to D[17:0] is latched and stored into the lower 18-bit Write Data register provided BWS[1:0] are both asserted active. On the subsequent rising edge of the negative input clock (K), the address is latched and the information presented to D[17:0] is stored into the Write Data register provided BWS[1:0] are both asserted active. The 36 bits of data are then written into the memory array at the specified location.

When deselected, the Write port will ignore all inputs after the pending Write operations have been completed.

Byte Write Operations

Byte Write operations are supported by the CY7C1303BV25. A Write operation is initiated as described in the Write Operation section above. The bytes that are written are deter- mined by BWS0 and BWS1 which are sampled with each set of 18-bit data word. Asserting the appropriate Byte Write Select input during the data portion of a write will allow the data being presented to be latched and written into the device. Deasserting the Byte Write Select input during the data portion of a write will allow the data stored in the device for that byte to remain unaltered. This feature can be used to simplify Read/Modify/Write operations to a Byte Write operation.

Single Clock Mode

The CY7C1303BV25 can be used with a single clock mode. In this mode the device will recognize only the pair of input clocks (K and K) that control both the input and output registers. This

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Contents Configurations FeaturesFunctional Description CY7C1303BV25 1M x CY7C1306BV25 512K xLogic Block Diagram CY7C1306BV25 Logic Block Diagram CY7C1303BV25Selection Guide CY7C1303BV25-167 UnitCY7C1306BV25 512K x Pin Configuration Ball Fbga 13 x 15 x 1.4 mm PinoutPin Definitions Introduction Concurrent Transactions Application Example1Depth Expansion Programmable ImpedanceComments Write Descriptions CY7C1303BV25 2Write Descriptions CY7C1306BV25 2 Ieee 1149.1 Serial Boundary Scan Jtag Sample Z EXIT2-IR UPDATE-DR UPDATE-IR TAP Controller State Diagram9TAP AC Switching Characteristics Over the Operating Range11 TAP Controller Block DiagramParameter Description Min Max Unit Output Times TAP Timing and Test Conditions12Identification Register Definitions Instruction Codes Scan Register SizesRegister Name Bit Size Instruction Code DescriptionBit # Bump ID Boundary Scan OrderThermal Resistance Maximum RatingsOperating Range Capacitance Switching Characteristics Over the Operating RangeAC Test Loads and Waveforms Parameter Description Test ConditionsWrite Read NOP Switching Waveforms25, 26Ordering Information Package DiagramCY7C1306BV25-167BZC CY7C1303BV25-167BZXC CY7C1306BV25-167BZI CY7C1303BV25-167BZXIDocument History Issue Date Orig. Description of ChangeSYT NXR