Appendix B Messages

Self-Test Messages

Self-Test Messages

Table 3-2 lists and describes messages that are generated by the Counter during Self-Test to indicate whether a component passed or failed its test. These messages are sent via the RS-232 serial output only—they do not appear on the Counter’s front-panel display.

Table 3-2. Self-Test Messages

Message

Description

 

 

ROM TEST FAIL

ROM failed read test.

ROM TEST OK

ROM passed read test.

 

 

RAM DATA LINES OK

RAM data lines passed test.

RAM DATA ERROR

RAM data lines failed test.

RAM ADDR LINES OK

RAM address lines passed test.

RAM ADDR ERROR

RAM address lines failed test.

RAM TEST OK

RAM tests completed with no errors detected.

 

 

EEPROM FAIL - CONFIGURATION

The configuration data saved in EEPROM

DATA

memory is defective.

 

 

ROM FAIL; Computed checkbyte does

The checksum of the ROM data does not match

not match the value stored in

the value stored in EEPROM.

EEPROM.

 

 

 

EEPROM FAIL - CONFIGURATION

The EEPROM org code does not verify with

DATA; Needs to be (re)initialized.

current revision of ROM code.

 

 

EEPROM FAIL - POWER CAL DATA;

The checksum of the EEPROM power-

Using default data

calibration table is bad. Factory default

 

calibration data will be used.

 

 

EEPROM FAIL - SAVED SETTINGS;

The checksum of the user settings stored in

Using default data

EEPROM is bad. Factory default settings will be

 

used.

 

 

EEPROM FAIL - SAVED SETTINGS;

The checksum of one set of user settings (1 – 9)

Invalid EEPROM SAV n Data.

stored in EEPROM is bad.

 

 

GPIB FAIL; Conf. Test

The GP-IB hardware failed its confidence test.

 

 

B

Operating Guide

B-3

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Agilent Technologies 53150A, 53152A, 53151A manual Self-Test Messages, Data

53151A, 53150A, 53152A specifications

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