Agilent Technologies 53150A manual 2. Self-Test Messages, Appendix B Messages, Operating Guide

Appendix B Messages

Self-Test Messages

Self-Test Messages

Table 3-2 lists and describes messages that are generated by the Counter during Self-Test to indicate whether a component passed or failed its test. These messages are sent via the RS-232 serial output only—they do not appear on the Counter’s front-panel display.

Table 3-2. Self-Test Messages

Message	Description
ROM TEST FAIL	ROM failed read test.
ROM TEST OK	ROM passed read test.
RAM DATA LINES OK	RAM data lines passed test.
RAM DATA ERROR	RAM data lines failed test.
RAM ADDR LINES OK	RAM address lines passed test.
RAM ADDR ERROR	RAM address lines failed test.
RAM TEST OK	RAM tests completed with no errors detected.
EEPROM FAIL - CONFIGURATION	The configuration data saved in EEPROM
DATA	memory is defective.
ROM FAIL; Computed checkbyte does	The checksum of the ROM data does not match
not match the value stored in	the value stored in EEPROM.
EEPROM.
EEPROM FAIL - CONFIGURATION	The EEPROM org code does not verify with
DATA; Needs to be (re)initialized.	current revision of ROM code.
EEPROM FAIL - POWER CAL DATA;	The checksum of the EEPROM power-
Using default data	calibration table is bad. Factory default
	calibration data will be used.
EEPROM FAIL - SAVED SETTINGS;	The checksum of the user settings stored in
Using default data	EEPROM is bad. Factory default settings will be
	used.
EEPROM FAIL - SAVED SETTINGS;	The checksum of one set of user settings (1 – 9)
Invalid EEPROM SAV n Data.	stored in EEPROM is bad.
GPIB FAIL; Conf. Test	The GP-IB hardware failed its confidence test.

B

Operating Guide B-3