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| PRELIMINARY |
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Data Retention and Endurance |
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| Parameter |
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| Description |
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| Min |
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DATAR | Data Retention |
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| 20 |
| Years |
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NVC | Nonvolatile STORE Operations |
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| 200 |
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| K |
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Capacitance |
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| Parameter[14] |
| Description |
| Test Conditions |
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| Max |
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CIN |
| Input Capacitance |
| TA = 25°C, f = 1 MHz, |
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| 7 |
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| VCC = 0 to 3.0V |
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COUT |
| Output Capacitance |
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| 7 |
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| pF |
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Thermal Resistance |
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| Parameter[14] |
| Description |
| Test Conditions |
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| Unit |
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| ΘJA |
| Thermal Resistance |
| Test conditions follow standard | 28.82 |
| TBD | 31.11 |
| TBD |
| °C/W |
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| (Junction to Ambient) |
| test methods and procedures for |
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| measuring thermal impedance, |
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| ΘJC |
| Thermal Resistance |
| 7.84 |
| TBD | 5.56 |
| TBD |
| °C/W |
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| in accordance with EIA/JESD51. |
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| (Junction to Case) |
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| Figure 5. AC Test Loads |
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3.0V | 577Ω | |
R1 | ||
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OUTPUT |
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30 pF
577Ω | for |
3.0V |
R1 |
OUTPUT |
R2 | 5 pF |
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| R2 | |
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789Ω |
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| 789Ω |
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AC Test Conditions
Input Pulse Levels | 0V to 3V |
Input Rise and Fall Times (10% - 90%) | <3 ns |
Input and Output Timing Reference Levels | 1.5V |
Note
14. These parameters are guaranteed by design and are not tested.
Document #: | Page 8 of 25 |
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