Cypress CY7C1471V33, CY7C1475V33, CY7C1473V33 3V TAP AC Test Conditions, 5V TAP AC Test Conditions

Page 17

CY7C1471V33

CY7C1473V33

CY7C1475V33

3.3V TAP AC Test Conditions

Input pulse levels

VSS to 3.3V

Input rise and fall times

1 ns

Input timing reference levels

1.5V

Output reference levels

1.5V

Test load termination supply voltage

1.5V

2.5V TAP AC Test Conditions

Input pulse levels

VSS to 2.5V

Input rise and fall time

1 ns

Input timing reference levels

1.25V

Output reference levels

1.25V

Test load termination supply voltage

1.25V

3.3V TAP AC Output Load Equivalent

2.5V TAP AC Output Load Equivalent

 

 

 

1.5V

 

 

 

1.25V

 

 

 

 

 

 

 

 

 

 

50

 

 

 

 

 

 

 

 

 

 

50

TDO

 

 

 

 

 

 

 

 

 

 

TDO

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

ZO= 50

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

20pF

 

ZO= 50

 

 

 

 

 

 

 

20pF

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

TAP DC Electrical Characteristics And Operating Conditions

(0°C < T < +70°C; V

DD

= 3.3V ±0.165V unless otherwise noted)[12]

 

 

 

 

A

 

 

 

 

 

 

 

Parameter

 

 

Description

Test Conditions

Min

Max

Unit

 

 

 

 

 

 

VOH1

Output HIGH Voltage

IOH = –4.0 mA, VDDQ = 3.3V

2.4

 

V

 

 

 

 

IOH = –1.0 mA, VDDQ = 2.5V

2.0

 

V

VOH2

Output HIGH Voltage

IOH = –100 µA

VDDQ = 3.3V

2.9

 

V

 

 

 

 

 

VDDQ = 2.5V

2.1

 

V

VOL1

Output LOW Voltage

IOL = 8.0 mA

VDDQ = 3.3V

 

0.4

V

 

 

 

 

IOL = 1.0 mA

VDDQ = 2.5V

 

0.4

V

VOL2

Output LOW Voltage

IOL = 100 µA

VDDQ = 3.3V

 

0.2

V

 

 

 

 

 

VDDQ = 2.5V

 

0.2

V

VIH

Input HIGH Voltage

 

VDDQ = 3.3V

2.0

VDD + 0.3

V

 

 

 

 

 

VDDQ = 2.5V

1.7

VDD + 0.3

V

VIL

Input LOW Voltage

 

VDDQ = 3.3V

–0.3

0.8

V

 

 

 

 

 

VDDQ = 2.5V

–0.3

0.7

V

IX

Input Load Current

GND < VIN < VDDQ

 

–5

5

µA

Note

12. All voltages refer to VSS (GND).

Document #: 38-05288 Rev. *J

Page 17 of 32

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Contents Functional Description FeaturesSelection Guide 133 MHz 117 MHz UnitLogic Block Diagram CY7C1473V33 4M x Logic Block Diagram CY7C1471V33 2M xLogic Block Diagram CY7C1475V33 1M x CY7C1471V33 Pin Configurations Pin Tqfp PinoutCY7C1473V33 CY7C1473V33 4M x ADV/LD Pin Definitions Burst Read Accesses Single Read AccessesSingle Write Accesses Functional OverviewZZ Mode Electrical Characteristics Interleaved Burst Address Table Mode = Floating or VDDLinear Burst Address Table Mode = GND Used Truth TableAddress Operation Function BW b BW a Truth Table for Read/WriteFunction Ieee 1149.1 Serial Boundary Scan Jtag TAP Controller State DiagramTAP Controller Block Diagram TAP Instruction Set TAP RegistersBypass TAP TimingParameter Description Min Max Unit Clock TAP AC Switching CharacteristicsOutput Times Hold Times3V TAP AC Test Conditions TAP DC Electrical Characteristics And Operating Conditions5V TAP AC Test Conditions Parameter Description Test Conditions MinIdentification Codes Identification Register DefinitionsScan Register Sizes Bit # Ball ID Boundary Scan Exit Order 2M xBoundary Scan Exit Order 4M x P10 Boundary Scan Exit Order 1M xW10 V10Maximum Ratings Electrical CharacteristicsOperating Range Range AmbientAC Test Loads and Waveforms CapacitanceThermal Resistance Description 133 MHz 117 MHz Unit Parameter Min Max Switching CharacteristicsSetup Times Read Switching WaveformsRite QA2 AddressStall Stall NOPDON’T Care Ordering Information Pin Thin Plastic Quad Flatpack 14 x 20 x 1.4 mm Package DiagramsBall Fbga 15 x 17 x 1.4 mm Ball Fbga 14 x 22 x 1.76 mm Document History Issue Orig. of Change Description of Change DateVKN/AESA VKN