Cypress CY14B104N AC Switching Characteristics, Switching Waveforms, Min Max, Sram Read Cycle

Page 9

CY14B104L, CY14B104N

AC Switching Characteristics

 

Parameters

Description

20 ns

25 ns

45 ns

Unit

 

Cypress

 

Alt

Min

Max

Min

Max

Min

Max

 

Parameters

 

Parameters

 

 

 

 

 

 

 

 

 

 

 

 

SRAM Read

Cycle

 

 

 

 

 

 

 

 

tACE

tACS

Chip Enable Access Time

 

20

 

25

 

45

ns

tRC[14]

tRC

Read Cycle Time

20

 

25

 

45

 

ns

t

[15]

t

AA

Address Access Time

 

20

 

25

 

45

ns

 

AA

 

 

 

 

 

 

 

 

 

tDOE

tOE

Output Enable to Data Valid

 

10

 

12

 

20

ns

tOHA[15]

tOH

Output Hold After Address Change

3

 

3

 

3

 

ns

tLZCE[16]

tLZ

Chip Enable to Output Active

3

 

3

 

3

 

ns

tHZCE[16]

tHZ

Chip Disable to Output Inactive

 

8

 

10

 

15

ns

tLZOE[16]

tOLZ

Output Enable to Output Active

0

 

0

 

0

 

ns

tHZOE[16]

tOHZ

Output Disable to Output Inactive

 

8

 

10

 

15

ns

tPU[13]

tPA

Chip Enable to Power Active

0

 

0

 

0

 

ns

tPD[13]

tPS

Chip Disable to Power Standby

 

20

 

25

 

45

ns

tDBE

-

Byte Enable to Data Valid

 

10

 

12

 

20

ns

tLZBE

-

Byte Enable to Output Active

0

 

0

 

0

 

ns

tHZBE

-

Byte Disable to Output Inactive

 

8

 

10

 

15

ns

SRAM Write

Cycle

 

 

 

 

 

 

 

 

tWC

tWC

Write Cycle Time

20

 

25

 

45

 

ns

tPWE

tWP

Write Pulse Width

15

 

20

 

30

 

ns

tSCE

tCW

Chip Enable To End of Write

15

 

20

 

30

 

ns

tSD

tDW

Data Setup to End of Write

8

 

10

 

15

 

ns

tHD

tDH

Data Hold After End of Write

0

 

0

 

0

 

ns

tAW

tAW

Address Setup to End of Write

15

 

20

 

30

 

ns

tSA

tAS

Address Setup to Start of Write

0

 

0

 

0

 

ns

tHA

tWR

Address Hold After End of Write

0

 

0

 

0

 

ns

tHZWE[16,17]

tWZ

Write Enable to Output Disable

 

8

 

10

 

15

ns

tLZWE[16]

tOW

Output Active after End of Write

3

 

3

 

3

 

ns

tBW

-

Byte Enable to End of Write

15

 

20

 

30

 

ns

Switching Waveforms

Figure 6. SRAM Read Cycle #1: Address Controlled[14, 15, 18]

 

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Notes

14.WE must be HIGH during SRAM read cycles.

15.Device is continuously selected with CE, OE and BHE / BLE LOW.

16.Measured ±200 mV from steady state output voltage.

17.If WE is LOW when CE goes LOW, the outputs remain in the high impedance state.

18.HSB must remain HIGH during READ and WRITE cycles.

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Document #: 001-07102 Rev. *L

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Contents Logic Block Diagram1, 2 FeaturesFunctional Description Cypress Semiconductor CorporationTop View PinoutsNot to scale TsopPin Definitions Sram Read Device OperationSram Write AutoStore OperationMode Selection Hardware Recall Power UpA15 A07 Mode Power Software StorePreventing AutoStore Mode Selection A15 A07 PowerData Protection Noise ConsiderationsMaximum Ratings DC Electrical CharacteristicsOperating Range RangeCapacitance Data Retention and EnduranceThermal Resistance AC Test ConditionsSwitching Waveforms AC Switching CharacteristicsMin Max Sram Read CycleCY14B104L, CY14B104N Sram Write Cycle #2 CE Controlled 3, 17, 18 AutoStore/Power Up Recall Parameters Description CY14B104L/CY14B104N Unit Min MaxHSB Parameters Description 20 ns 25 ns 45 ns Unit Min Max Software Controlled STORE/RECALL CycleHardware Store Cycle Hardware Store Pulse WidthHardware Store LOW to Store Busy 500 Inputs/Outputs2 Mode Power Truth Table For Sram OperationsHigh Z Ordering Information CY14B104L-ZS45XIT CY14B104L-ZS45XCTCY14B104L-BA45XCT CY14B104L-BA45XITCY 14 B 104 L ZS P 20 X C T Part Numbering NomenclatureZS Tsop NvsramPin Tsop II Package DiagramsBall Fbga 6 mm x 10 mm x 1.2 mm 51-85160 TUP Document HistoryPCI UHAGVCH/PYRS GVCH/DSG AesaUSB Sales, Solutions, and Legal Information