Cypress CY14B101LA, CY14B101NA manual Data Retention and Endurance, Capacitance, Thermal Resistance

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PRELIMINARY

 

CY14B101LA, CY14B101NA

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Data Retention and Endurance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter

 

 

 

 

 

Description

 

 

 

Min

 

Unit

 

 

DATAR

Data Retention

 

 

 

 

 

20

 

Years

 

 

NVC

Nonvolatile STORE Operations

 

 

 

200

 

 

K

 

 

Capacitance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter[14]

 

Description

 

Test Conditions

 

 

Max

 

Unit

 

 

CIN

 

Input Capacitance

 

TA = 25°C, f = 1 MHz,

 

 

 

7

 

 

pF

 

 

 

 

 

 

 

VCC = 0 to 3.0V

 

 

 

 

 

 

 

 

 

COUT

 

Output Capacitance

 

 

 

 

7

 

 

pF

 

 

Thermal Resistance

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Parameter[14]

 

Description

 

Test Conditions

48-FBGA

48-SSOP

44-TSOP II

32-SOIC

 

Unit

 

 

 

ΘJA

 

Thermal Resistance

 

Test conditions follow standard

28.82

 

TBD

31.11

 

TBD

 

°C/W

 

 

 

 

 

(Junction to Ambient)

 

test methods and procedures for

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

measuring thermal impedance,

 

 

 

 

 

 

 

 

 

 

 

ΘJC

 

Thermal Resistance

 

7.84

 

TBD

5.56

 

TBD

 

°C/W

 

 

 

 

 

in accordance with EIA/JESD51.

 

 

 

 

 

 

 

(Junction to Case)

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

Figure 5. AC Test Loads

 

 

 

 

 

 

 

 

 

3.0V

577Ω

R1

 

OUTPUT

 

30 pF

577Ω

for tri-state specs

3.0V

R1

OUTPUT

R2

5 pF

 

 

 

 

 

 

 

 

 

 

 

 

R2

 

 

 

 

789Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

789Ω

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

 

AC Test Conditions

Input Pulse Levels

0V to 3V

Input Rise and Fall Times (10% - 90%)

<3 ns

Input and Output Timing Reference Levels

1.5V

Note

14. These parameters are guaranteed by design and are not tested.

Document #: 001-42879 Rev. *B

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Contents Features Logic Block Diagram1, 2Functional Description Cypress Semiconductor CorporationNot to scale PinoutsTop View Output Enable, Active LOW. The active LOW Byte High Enable, Active LOW. Controls DQ15 DQ8Byte Low Enable, Active LOW. Controls DQ7 DQ0 Power Supply Inputs to the Device .0V +20%, -10%Device Operation Sram ReadSram Write AutoStore OperationHardware Recall Power Up Mode SelectionA15 A09 Mode Power Software StoreMode Selection A15 A09 Preventing AutoStoreData Protection Noise ConsiderationsDC Electrical Characteristics Maximum RatingsOperating Range RangeData Retention and Endurance CapacitanceThermal Resistance AC Test ConditionsAC Switching Characteristics Switching WaveformsParameters Sram Read Cycle Sram Write CycleSram Read Cycle #2 CE and OE Controlled 3, 15 Sram Write Cycle #2 CE Controlled 3, 18, 19 AutoStore/Power Up Recall Parameters Description 20 ns 25 ns 45 ns Unit Min MaxSoftware Controlled STORE/RECALL Cycle Description 20 ns 25 ns 45 ns Unit Min MaxTo Output Active Time when write latch not set Hardware Store CycleDescription 20ns 25ns 45ns Unit Min Max Hardware Store Pulse WidthTruth Table for x8 Configuration Inputs/Outputs Mode Power Truth Table for x16 ConfigurationInputs/Outputs Mode Power Truth Table For Sram OperationsOrdering Information CY14B101LA-ZS25XCT CY14B101LA-ZS25XCCY14B101LA-BA25XCT CY14B101LA-BA25XCCY14B101LA-ZS45XCT CY14B101LA-ZS45XCCY14B101LA-BA45XCT CY14B101LA-BA45XCPart Numbering Nomenclature CY 14 B 101L A-ZS 20 X C TZS Tsop NvsramPackage Diagrams Pin Tsop IIBall Fbga 6 mm x 10 mm x 1.2 mm Pin Ssop Pin Soic Document History UNC/PYRSGVCH/AESA GVCH/PYRSSales, Solutions, and Legal Information USB