Item (NB Cont.) |
| Specification |
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Features | • | The RS880M complies with all relevant Windows Logo Program |
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| (WLP) requirements from Microsoft for WHQL certification. |
| Test Capability Features | |
| The RS880M has a variety of test modes and capabilities that provide a | |
| very high fault coverage and low DPM (Defect Per Million) ratio: | |
| • Full scan implementation on the digital core logic through ATPG | |
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| (Automatic Test Pattern Generation Vectors). |
| • Dedicated test logic for the | |
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| provide complete coverage on these modules. |
| • A JTAG test mode to allow board level testing of neighboring | |
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| devices. |
| • An EXOR tree test mode on all the digital I/O's to allow for proper | |
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| soldering verification at the board level. |
| • A VOH/VOL test mode on all digital I/O¡¦s to allow for proper | |
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| verification of output high and output low values at the board level. |
| • Access to the analog modules to allow full evaluation and | |
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| characterization. |
| • IDDQ mode support to allow chip evaluation through current leakage | |
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| measurements. |
| • These test modes can be accessed through the settings on the | |
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| instruction register of the JTAG circuitry. |
| • | Additional Features |
| • Integrated spread spectrum PLLs on the memory and LVDS | |
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| interface. |
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20 | Chapter 1 |
